11921014

System and Method for Monitoring Manufacturing

PublishedMarch 5, 2024
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
17 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The computer system of claim 1, wherein the plurality of data sources includes data streams.

3

3. The computer system of claim 1, wherein the data from the plurality of data sources includes data in a first format and data in a second format, wherein the first format and the second format are different.

4

4. The computer system of claim 1, wherein the data model includes a set of one or more explicit models.

5

5. The computer system of claim 4, wherein the set of one or more explicit models include shift schedules, factory locations time zones, or line topographies.

6

6. The computer system of claim 1, wherein the data model includes a set of one or more hybrid models.

7

7. The computer system of claim 6, wherein the set of one or more hybrid models are extrapolated from the data from the buffer.

8

8. The computer system of claim 1, wherein the data driven model includes a cycle model, a downtime model, a defect model, a batch model, or a parts model.

10

10. The non-transitory computer readable storage medium of claim 9, wherein the plurality of data sources includes data streams.

11

11. The non-transitory computer readable storage medium of claim 9, wherein the data from the plurality of data sources includes data in a first format and data in a second format, wherein the first format and the second format are different.

12

12. The non-transitory computer readable storage medium of claim 9, wherein the data model includes a set of one or more explicit models.

13

13. The non-transitory computer readable storage medium of claim 12, wherein the set of one or more explicit models include shift schedules, factory locations time zones, or line topographies.

14

14. The non-transitory computer readable storage medium of claim 9, wherein the data model includes a set of one or more hybrid models.

15

15. Non-transitory computer readable storage medium of claim 14, wherein the set of one or more hybrid models are extrapolated from the data from the buffer.

16

16. The non-transitory computer readable storage medium of claim 9, wherein the data driven model includes a cycle model, a downtime model, a defect model, a batch model, or a parts model.

18

18. The method of claim 17, wherein the plurality of data sources includes data streams.

19

19. The method of claim 17, wherein the data from the plurality of data sources includes data in a first format and data in a second format, wherein the first format and the second format are different.

20

20. The method of claim 17, wherein the data model includes a set of one or more explicit models.

Patent Metadata

Filing Date

Unknown

Publication Date

March 5, 2024

Inventors

Nathan OOSTENDORP
Kurtis Alan DEMAAGD
Ryan L. SMITH

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Cite as: Patentable. “SYSTEM AND METHOD FOR MONITORING MANUFACTURING” (11921014). https://patentable.app/patents/11921014

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