Method and Device for Processing Data Stored in a Memory Unit

7. The method as recited in 6, wherein all of the first subarea and the multiple further subareas of the memory area have the same length as one another.

8. The method as recited in 6, wherein two or more of the first subarea and the multiple further subareas of the memory area have different lengths than one another.

9. The method as recited in claim 4, wherein the one or more storage parameters includes a length parameter whose value identifies a length of the first subarea, which is ascertainable from at least one other part of the sequence of numbers.

10. The method as recited in claim 1, wherein the respective value for the each of one of more storage parameters of the test pattern further identifies a location of at least one second subarea within the memory area, the at least one second subarea not directly bordering the first subarea within the memory area.

11. The method as recited in claim 1, wherein the respective value for the each of one of more storage parameters of the test pattern further identifies respective locations of multiple further subareas within the memory area.

12. The method as recited in claim 1, wherein the test pattern does not identify a location of an entirety of the memory area.

14. The method as recited in claim 1, wherein the forming of the test variable includes: forming a primary test variable as a function of the obtained data and forming a secondary test variable at least as a function of the primary test variable.

16. The method as recited in claim 15, wherein the formation of the secondary test value carried out additionally based on at least one part of the primary test variable.