Legal claims defining the scope of protection, as filed with the USPTO.
2. The mother substrate of claim 1, wherein the test gate terminal is connected to the test signal provider, and is configured to receive the test signal from the test signal provider.
4. The mother substrate of claim 1, wherein the bridge pattern comprises a conductive metal oxide.
5. The mother substrate of claim 1, wherein, when a voltage level of the test voltage changes, a voltage level of a voltage received by the test source terminal changes.
6. The mother substrate of claim 1, wherein a voltage level of the test voltage is greater than a voltage level of a first voltage of the first voltage line.
8. The mother substrate of claim 7, wherein the first voltage bus is located between the pixel circuit and the test transistor.
Unknown
August 6, 2024
Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.