12106466

Photographing Condition Determining Method for Metal Structure, Photographing Method for Metal Structure, Phase Classification Method for Metal Structure, Photographing Condition Determining Device for Metal Structure, Photographing Device for Metal Structure, Phase Classification Device for Metal Structure, Material Property Estimating Method for Metal Material, and Material Property Estimating Device for Metal Material

PublishedOctober 1, 2024
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
11 claims

Legal claims defining the scope of protection, as filed with the USPTO.

3

3. The method according to claim 1, wherein the photographing condition includes at least one of a contrast value, a brightness value, and an intensity of a light source.

5

5. A photographing method for a metal structure, wherein the other parts of the metal structure of the metal material are photographed under the photographing condition determined by the photographing condition determining method after the photographing condition determining method for a metal structure according to claim 1.

6

6. A phase classification method for a metal structure, comprising the steps of: photographing the metal structure by the photographing method for a metal structure according to claim 5; and classifying phases of the metal structure.

9

9. The method according to claim 8, wherein, in the photographing condition determining step, a photographing condition under which a classification accuracy of the phases in the phase classification step is a highest among the photographing conditions used in the photographing step is determined as a photographing condition for photographing the other parts of the metal structure.

10

10. The method according to claim 8, wherein the photographing condition includes at least one of a contrast value, a brightness value, and an intensity of a light source.

12

12. A photographing method for a metal structure, wherein the other parts of the metal structure of the metal material are photographed under the photographing condition determined by the photographing condition determining method after the method according to claim 8.

13

13. A phase classification method for a metal structure, comprising the steps of: photographing the metal structure by the method according to claim 12; and classifying phases of the metal structure.

15

15. A photographing device for a metal structure, wherein the other parts of the metal structure of the metal material are photographed under the photographing condition determined by the photographing condition determining device according to claim 14.

16

16. A phase classification device for a metal structure, wherein the metal structure is photographed by the photographing device for a metal structure according to claim 15, and phases of the metal structure are classified.

18

18. A photographing device for a metal structure, wherein the other parts of the metal structure of the metal material are photographed under the photographing condition determined by the device according to claim 17.

19

19. A phase classification device for a metal structure, wherein the metal structure is photographed by the device according to claim 18, and phases of the metal structure are classified.

Patent Metadata

Filing Date

Unknown

Publication Date

October 1, 2024

Inventors

Naoya Kiyokane
Yoshie Obata
Shin Ishikawa
Takako Yamashita
Takeshi Nishiyama

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Analysis on this page is generated by Patentable — an AI-powered patent intelligence platform. AI-generated summaries, explanations, and analysis may be reused with attribution and a visible link back to the canonical URL below. Patent abstracts and claims are USPTO public domain.

Cite as: Patentable. “PHOTOGRAPHING CONDITION DETERMINING METHOD FOR METAL STRUCTURE, PHOTOGRAPHING METHOD FOR METAL STRUCTURE, PHASE CLASSIFICATION METHOD FOR METAL STRUCTURE, PHOTOGRAPHING CONDITION DETERMINING DEVICE FOR METAL STRUCTURE, PHOTOGRAPHING DEVICE FOR METAL STRUCTURE, PHASE CLASSIFICATION DEVICE FOR METAL STRUCTURE, MATERIAL PROPERTY ESTIMATING METHOD FOR METAL MATERIAL, AND MATERIAL PROPERTY ESTIMATING DEVICE FOR METAL MATERIAL” (12106466). https://patentable.app/patents/12106466

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