12160759

Configured Time Gap for Si Beam Failure Measurement and Indication

PublishedDecember 3, 2024
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
12 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The apparatus of claim 1, wherein the one or more time gap periods are aperiodic, periodic, or semi-persistent.

3

3. The apparatus of claim 1, wherein the one or more time gap periods are specific to the UE.

4

4. The apparatus of claim 1, wherein the one or more time gap periods are specific to a group of UEs including the UE.

5

5. The apparatus of claim 1, wherein to receive the indication of the configuration of the one or more time gap periods, the at least one processor is configured to receive the indication of the configuration of the one or more time gap periods from the base station via one of a downlink control information (DCI) message, a medium access control (MAC)—control element (CE) (MAC-CE), or a radio resource control (RRC) message.

6

6. The apparatus of claim 1, wherein the one or more measurements of the quality of the one or more FD beam pairs comprise a preconfigured SI measurement.

7

7. The apparatus of claim 6, wherein the SI measurement is performed for a first FD beam pair of the one or more FD beam pairs when the UE transmits an uplink reference signal via an uplink beam of the first FD beam pair and receives one or more messages or signals via a downlink beam of the first FD beam pair.

8

8. The apparatus of claim 6, wherein the one or more measurements of the quality of the one or more FD beam pairs further comprise one or more signal quality measurements, and the one or more signal quality measurements comprise a downlink signal quality measurement based on at least one downlink reference signal.

9

9. The apparatus of claim 8, wherein the at least one downlink reference signal comprises one of a demodulation reference signal (DMRS), a channel state information (CSI)—reference signal (RS) (CSI-RS), or a synchronization signal block (SSB).

10

10. The apparatus of claim 8, wherein the at least one downlink reference signal is a latest downlink reference signal before a corresponding time gap period of the one or more time gap periods, and the at least one downlink reference signal is received from the base station within a time period of a preconfigured duration immediately preceding the corresponding time gap period.

11

11. The apparatus of claim 8, wherein the at least one downlink reference signal is received from the base station during at least one of the one or more time gap periods.

12

12. The apparatus of claim 8, wherein an indication of a signal-to-interference-plus-noise-ratio (SINR) threshold associated with the SI measurement and the one or more signal quality measurements is received from the base station via one or more configured downlink reference signals during the one or more time gap periods.

15

15. The apparatus of claim 14, the at least one processor being further configured to: transmit, to the UE, at least one of an SI level threshold or a signal-to-interference-plus-noise-ratio (SINR) threshold associated with one or more measurements of a quality of one or more FD beam pairs, each of the one or more FD beam pairs comprising an uplink beam and a downlink beam.

Patent Metadata

Filing Date

Unknown

Publication Date

December 3, 2024

Inventors

Qian ZHANG
Yan ZHOU
Tao LUO

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Cite as: Patentable. “CONFIGURED TIME GAP FOR SI BEAM FAILURE MEASUREMENT AND INDICATION” (12160759). https://patentable.app/patents/12160759

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CONFIGURED TIME GAP FOR SI BEAM FAILURE MEASUREMENT AND INDICATION — Qian ZHANG | Patentable