12165102

System and Method of Anomaly Detection using Machine Learning and a Local Outlier Factor

PublishedDecember 10, 2024
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
5 claims

Legal claims defining the scope of protection, as filed with the USPTO.

3

3. The system of claim 1, wherein the supply chain data further comprises data related to one or more sales categories.

7

7. The system of claim 1, wherein the optimal K-values are generated based on an elbow method.

10

10. The method of claim 8, wherein the supply chain data further comprises data related to one or more sales categories.

14

14. The method of claim 8, wherein the optimal K-values are generated based on an elbow method.

17

17. The non-transitory computer-readable storage medium of claim 15, wherein the supply chain data further comprises data related to one or more sales categories.

Patent Metadata

Filing Date

Unknown

Publication Date

December 10, 2024

Inventors

Swapnil Santosh Kumar Bhure
Sunil Morajkar

Want to explore more patents?

Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.

Citation & reuse

Analysis on this page is generated by Patentable — an AI-powered patent intelligence platform. AI-generated summaries, explanations, and analysis may be reused with attribution and a visible link back to the canonical URL below. Patent abstracts and claims are USPTO public domain.

Cite as: Patentable. “System and Method of Anomaly Detection using Machine Learning and a Local Outlier Factor” (12165102). https://patentable.app/patents/12165102

© 2026 Patentable. All rights reserved.

Patentable is a research and drafting-assistant tool, not a law firm, and does not provide legal advice. Documents we generate are drafts for review by a licensed patent attorney.