Endpoint Optimization for Semiconductor Processes

1. A method of optimizing light sources used to monitor semiconductor processes, the method comprising: receiving an image of a wafer; determining, based on the image of the wafer, a characterization of intensities of light that will be reflected from the wafer during a semiconductor process; and determining, based on characterizing the intensity of the light, an intensity of a light source to be directed at the wafer during a semiconductor process.

2. The method of claim 1, wherein the image of the wafer comprises an image captured outside of a semiconductor processing chamber while the wafer is still and before the wafer is subjected to an etch process.

3. The method of claim 1, wherein the image of the wafer comprises a grayscale image, and pixel values in the grayscale image characterize intensities of light that will be reflected from corresponding locations on the wafer during the semiconductor process.

4. The method of claim 1, storing the intensity of the light source as a recipe parameter for the semiconductor process, and executing the semiconductor process on the wafer using the recipe parameter to control the intensity of the light source during the semiconductor process.

5. The method of claim 1, wherein the image of the wafer comprises an image captured inside of a semiconductor processing chamber while the wafer is rotated and before the wafer is subjected to an etch process.

6. The method of claim 1, wherein: determining the characterization of the intensities of light comprises: providing the image of the wafer or the characterization of intensities of light as an input to a model; and determining the intensity of the light source to be directed at the wafer during a semiconductor process comprises: receiving an output from the model used to determine the intensity of the light source.

7. The method of claim 1, wherein the characterization of intensities of light comprises a histogram of pixel values in the image of the wafer.

8. The method of claim 1, wherein determining the intensity of the light source to be directed at the wafer during a semiconductor process comprises: iteratively increasing or decreasing pixel values in the image of the wafer corresponding to an increase or decrease in the intensity of the light source until the characterization of the intensities of light that will be reflected is in a range that will produce a clean and repeatable trace.

9. A method of optimizing camera sampling rates used to monitor semiconductor processes, the method comprising: receiving a time sequence of light intensity measurements from a view of a wafer being rotated; converting the time sequence of light intensity measurements into a frequency domain signal; determining whether a distortion signal is present in the frequency domain signal; and determining a camera sampling rate based on whether the distortion signal is present in the frequency domain signal.

10. The method of claim 9, wherein the view of the wafer comprises a camera view of the wafer as the wafer is rotated in a semiconductor processing chamber while the wafer before the wafer is subjected to an etch process.

11. The method of claim 9, wherein the view of the wafer comprises a virtual rotation of an image of the wafer.

12. The method of claim 9, wherein determining the camera sampling rate based on whether the distortion signal is present in the frequency domain signal comprises: determining that the distortion signal is present in the frequency domain signal; and increasing the camera sampling rate relative to a camera sampling rate used to capture the time sequence of light intensity measurements.

13. The method of claim 12, further comprising: iteratively increasing the camera sampling rate, and receiving a new time sequence of light intensity measurements after increasing the sampling rate until the distortion signal is no longer present in the frequency domain signal.

14. The method of claim 9, wherein determining the camera sampling rate based on whether the distortion signal is present in the frequency domain signal comprises: determining that the distortion signal is not present in the frequency domain signal; and decreasing the camera sampling rate relative to a camera sampling rate used to capture the time sequence of light intensity measurements.

15. The method of claim 14, further comprising: iteratively decreasing the camera sampling rate, and receiving a new time sequence of light intensity measurements after decreasing the sampling rate until the distortion signal is present in the frequency domain signal, then increasing the sampling rate enough to remove the distortion signal.

16. The method of claim 9, further comprising storing the camera sampling rate as a recipe parameter for the semiconductor process, and executing the semiconductor process on the wafer using the recipe parameter to control the camera sampling rate during the semiconductor process.

17. A method of determining endpoints for semiconductor processes, the method comprising: determining, based on an image of a wafer, an intensity of a light source to be directed at the wafer during a semiconductor process; determining a camera sampling rate based on distortion in a frequency domain representation of a first time sequence of light intensity measurements from a view of the wafer while being rotated; performing the semiconductor process on the wafer and recording a second time sequence of light intensity measurements from the wafer during an actual execution of the semiconductor process on the wafer; determining an endpoint for the semiconductor process based on the second time sequence of light intensity measurements; and causing the endpoint to be stored in a recipe for processing the wafer.

18. The method of claim 17, wherein: determining the intensity of the light source comprises: receiving the image of a wafer; determining, based on the image of the wafer, a characterization of intensities of light that will be reflected from the wafer during a semiconductor process; and determining, based on characterizing the intensity of the light, the intensity of the light source to be directed at the wafer during a semiconductor process; and determining the camera sampling rate comprises: receiving a time sequence of light intensity measurements from a view of a wafer being rotated; converting the time sequence of light intensity measurements into a frequency domain signal; determining whether a distortion signal is present in the frequency domain signal; and determining the camera sampling rate based on whether the distortion signal is present in the frequency domain signal.

19. The method of claim 17, wherein the second time sequence of light intensity measurements for the etch process is sufficient to generate the endpoint as a repeatable trace without requiring destruction of more than one wafer.

20. The method of claim 17, further comprising: executing the semiconductor process on the wafer using the recipe to control the camera sampling rate during the semiconductor process and using the recipe to control the intensity of the light source during the semiconductor process.