High Resolution Analysis System

1. A method for high resolution sub-surface analysis of a target, the method comprising: generating a first repetitive optical signal; broadening the spectral width of said first repetitive optical signal to form a first broadened optical signal; applying at least part of said first broadened optical signal to a target to be analyzed; capturing at least part of said first broadened optical signal returned from the target to form a captured returned broadened optical signal which is a returned optical signal; generating a second repetitive optical signal; broadening the spectral width of said second repetitive optical signal to form a second broadened optical signal which is a reference optical signal; combining the returned optical signal with the reference optical signal; modifying the coherence phase relationship between the returned optical signal and the reference optical signal; detecting an interference signal between the returned optical signal and the reference optical signal; processing the detected interference signals at multiple coherence phase relationships; performing high resolution analysis of the target; and storing the analysis data in non-volatile memory for display, for further analysis, or for future operation of said method.

2. The method of claim 1 , wherein a repetitive optical signal is generated by a pulsed laser source.

3. The method of claim 2 , wherein the mode locked laser source is a mode locked semiconductor laser.

4. The method of claim 1 , wherein broadening of the spectral width is achieved by means of a non linear material.

5. The method of claim 4 , wherein the non-linear material comprises a resonant micro ring.

6. The method of claim 4 , wherein the non-linear material is contained within the laser cavity.

7. The method of claim 4 , wherein the non-linear material is a non-linear fiber.

8. The method of claim 1 , wherein part of the first broadened optical signal returned from the target to form a captured returned broadened optical signal is returned due to scattering properties of the target.

9. The method of claim 1 , wherein part of the first broadened optical signal returned from the target to form a captured returned broadened optical signal is returned due to discontinuities in the target.

10. The method of claim 9 , wherein the discontinuities in the target are caused by changes of refractive index.

11. The method of claim 1 , wherein the first repetitive optical signal has a frequency offset from the second repetitive optical signal.

12. The method of claim 1 , wherein the first repetitive optical signal has a varying phase offset from the second repetitive optical signal.

13. The method of claim 1 , wherein the returned optical signal and the reference optical signal are combined interferometrically.

14. The method of claim 1 , wherein the interference signal between the returned optical signal and the reference optical signal is detected by means of at least one opto-electronic detectors.

15. The method of claim 1 , wherein the interference signal between the returned optical signal and the reference optical signal is detected, processed and analyzed by an electronic processing system to generate an image of the target to be analyzed.

16. The method of claim 1 , wherein the interference signal between the returned optical signal and the reference optical signal is detected, processed and analyzed by an electronic processing system to determine an analyte concentration of the target to be analyzed.

17. A system for high resolution sub-surface analysis of a target comprising: a first pulsed light source for generating a first repetitive optical signal; a first resonator for broadening the spectral width of said first repetitive optical signal to form a first broadened optical signal; a lens for applying at least part of said first broadened optical signal to a target to be analyzed, said lens capturing at least part of said first broadened optical signal returned from the target to form a captured returned broadened optical signal which is a returned optical signal; a second pulsed light source for generating a second repetitive optical signal; a second resonator for broadening the spectral width of said second repetitive optical signal to form a second broadened optical signal which is a reference optical signal, wherein the resonator also modifies the coherence phase relationship between the returned optical signal and the reference optical signal; a beamsplitter for combining the returned optical signal with the reference optical signal; an opto-electronic detector for detecting an interference signal between the returned optical signal and the reference optical signal; and a processor for processing the detected interference signals at multiple coherence phase relationships and performing high resolution analysis of the target; and non-volatile memory for storing the analysis data for display, for further analysis, or for future operation of said system.

18. An apparatus for high resolution sub-surface analysis of a target comprising: means for generating a first repetitive optical signal; means for broadening the spectral width of said first repetitive optical signal to form a first broadened optical signal; means for applying at least part of said first broadened optical signal to a target to be analyzed; means for capturing at least part of said first broadened optical signal returned from the target to form a captured returned broadened optical signal which is a returned optical signal; means for generating a second repetitive optical signal; means for broadening the spectral width of said second repetitive optical signal to form a second broadened optical signal which is a reference optical signal; means for combining the returned optical signal with the reference optical signal; means for modifying the coherence phase relationship between the returned optical signal and the reference optical signal; means for detecting an interference signal between the returned optical signal and the reference optical signal; means for processing the detected interference signals at multiple coherence phase relationships; means for performing high resolution analysis of the target; and means for storing the analysis data in non-volatile memory for display, for further analysis, or for future operation of said method.

19. The apparatus of claim 18 , wherein a repetitive optical signal is generated by a pulsed laser source.

20. The apparatus of claim 19 , wherein the mode locked laser source is a mode locked semiconductor laser.

21. The apparatus of claim 18 , wherein broadening of the spectral width is achieved by means of a non linear material.

22. The apparatus of claim 21 , wherein the non-linear material comprises a resonant micro ring.

23. The apparatus of claim 21 , wherein the non-linear material is contained within the laser cavity.

24. The apparatus of claim 21 , wherein the non-linear material is a non-linear fiber.

25. The apparatus of claim 18 , wherein part of the first broadened optical signal returned from the target to form a captured returned broadened optical signal is returned due to scattering properties of the target.

26. The apparatus of claim 18 , wherein part of the first broadened optical signal returned from the target to form a captured returned broadened optical signal is returned due to discontinuities in the target.

27. The apparatus of claim 26 , wherein the discontinuities in the target are caused by changes of refractive index.

28. The apparatus of claim 18 , wherein the first repetitive optical signal has a frequency offset from the second repetitive optical signal.

29. The apparatus of claim 18 , wherein the first repetitive optical signal has a varying phase offset from the second repetitive optical signal.

30. The apparatus of claim 18 , wherein the returned optical signal and the reference optical signal are combined interferometrically.

31. The apparatus of claim 18 , wherein the interference signal between the returned optical signal and the reference optical signal is detected by means of at least one opto-electronic detectors.

32. The apparatus of claim 18 , wherein the interference signal between the returned optical signal and the reference optical signal is detected, processed and analyzed by an electronic processing system to generate an image of the target to be analyzed.

33. The apparatus of claim 18 , wherein the interference signal between the returned optical signal and the reference optical signal is detected, processed and analyzed by an electronic processing system to determine an analyte concentration of the target to be analyzed.