8988520

Method and Apparatus for Improving Depth of Field (dof) in Microscopy

PublishedMarch 24, 2015
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
16 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A method for improving depth for field (DOF) in microscopic imaging, the method comprising: combining a sequence of images captured from different focal distances to form an all-focus image, comprising: computing a focus measure at every pixel of each image of the sequence of images; finding one or more largest peaks of a one-dimensional function applied to the focus measure at each position in the focus measure as multiple candidate values; and blending the multiple candidate values according to the focus measure to determine a pixel value for the all-focus image and repeating for every pixel.

2

2. The method of claim 1 , wherein the sequence of images is stacked in a Z-stack along a Z dimension corresponding to depth.

3

3. The method of claim 1 , wherein combining the sequence of images captured from different focal distances and forming the all-focus image further comprises reducing data from three dimensions to two dimensions.

4

4. The method of claim 1 , wherein computing the focus measure at every pixel further comprises convolving the sequence of images with a Two-Dimensional (2-D) high-pass filter to generate a convolution result; converting the convolution result to a positive signal using an absolute value at each position to generate a converted signal; and convolving the converted signal with a 2-D low-pass filter.

5

5. The method of claim 1 , wherein finding the largest peaks at each position in the focus measure further comprises computing the focus measure as a One-Dimensional (1-D) function of z at each position in the focus measure; finding one or more peaks in the One-Dimensional (1-D) function of z based on the computed focus measure; smoothing the 1-D function of z by using a low-pass filter to generate a smoothed 1-D function; and finding the peaks in the smoothed 1-D function.

6

6. The method of claim 4 , wherein converting the convolution result comprises using the square of the absolute value instead of the absolute value.

7

7. The method of claim 5 , wherein finding the one or more peaks at each position in the focus measure further comprises refining the peaks found by finding the peak in an unsmoothed version of the 1-D function of z in a neighborhood of the peak found from the smoothed 1-D function.

9

9. An apparatus for improving depth of field (DOF) in microscopic imaging, the apparatus comprising: a digital microscope for capturing microscope images of a specimen at different depths for creating a sequence of images; and an extended depth of field (EDOF) generator module for extending the depth of field of the specimen by forming an all focus image, comprising an all focus image generator module for: computing a focus measure at every pixel of each image in the sequence of images; finding one or more largest peaks of a one-dimensional function applied to the focus measure at each position in the focus measure as a multiple candidate values; and blending the multiple candidate values according to the focus measure in order to determine a pixel value for an all-focus image and repeating for every pixel.

10

10. The apparatus of claim 9 , wherein the sequence of images is stacked in a Z-stack along Z dimension corresponding to depth.

11

11. The apparatus of claim 9 , wherein combining the sequence of images captured from different focal distances and forming the all-focus image further comprises reducing data from three dimensions to two dimensions.

12

12. The apparatus of claim 9 , wherein computing the focus measure at every pixel further comprises convolving the sequence of images with a Two-Dimensional (2-D) high-pass filter; to generate a convolution result; converting the convulution result to a positive signal using an absolute value at each position to generate a converted signal; and convolving the converted signal with a 2-D low-pass filter.

13

13. The apparatus of claim 9 , wherein finding the largest peaks at each position in the focus measure further comprises: the EDOF generator module computes the focus measure as a One-Dimensional (1-D) function of z at each position in the focus measure, finding one or more peaks in the One-Dimensional (1-D) function of z based on the computed focus measure, smoothing the 1-D function of z by using a low-pass filter to generate a smoothed 1-D function, and finding the peaks in smoothed 1-D function.

14

14. The apparatus of claim 12 , wherein converting the convultion result of comprises using the square of the absolute value, instead of the absolute value.

15

15. The apparatus of claim 13 , wherein finding the one or more peaks at each position in the focus measure further comprises refining the peaks found by finding the peak in an unsmoothed version of the 1-D function of z in a neighborhood of the peak found from the smoothed 1-D function.

16

16. A method for improving depth of field (DOF) in microscopic imaging, the method comprising: combining a sequence of images captured from different focal distances to form an all-focus image, comprising: computing a focus measure at every pixel of each image of the sequence of images by: convolving the sequence of images with a Two-Dimensional (2-D) high-pass filter to generate a convolution result; converting the convolution result to a positive signal using an absolute value at each position to generate a converted signal; and convolving the converted signal with a 2-D low-pass filter; finding one or more largest peaks at each position in the focus measure as multiple candidate values; and blending the multiple candidate values according to the focus measure to determine a pixel value for the all-focus image and repeating for every pixel.

17

17. The method of claim 16 , wherein converting the convolution result comprises using the square of the absolute value instead of the absolute value.

Patent Metadata

Filing Date

Unknown

Publication Date

March 24, 2015

Inventors

MING-CHANG LIU
MARK ROBERTSON

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Cite as: Patentable. “METHOD AND APPARATUS FOR IMPROVING DEPTH OF FIELD (DOF) IN MICROSCOPY” (8988520). https://patentable.app/patents/8988520

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METHOD AND APPARATUS FOR IMPROVING DEPTH OF FIELD (DOF) IN MICROSCOPY — MING-CHANG LIU | Patentable