9270518

Computer System and Rule Generation Method

PublishedFebruary 23, 2016
Assigneenot available in USPTO data we have
Technical Abstract

Patent Claims
14 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A computer system, comprising: a plurality of sensors mounted in a plurality of devices to measure specified physical quantities; and a server configured to examine the physical quantities sent from the sensors, wherein the devices are classified into a first device group, and a plurality of second device groups, wherein the second device groups include a plurality of second examination rules showing examination methods for the physical quantities, wherein the server includes a storage device, wherein the server is configured to store, in the storage device, an attribute which indicates types of the plurality of devices and types of the physical quantities measured by the sensors, and store sensor information of devices, the sensor information including an attribute value of the attribute, regarding the first device group and the second device groups, wherein the server is configured to store, in the storage device, examination information indicating the second examination rules included in the second device groups, wherein the server is configured to calculate a similarity coefficient of the attribute, wherein the server is configured to calculate, by using the sensor information, similarities between each device in the first device group and each device in the second device group, by obtaining multipliers from the calculated similarity coefficient of the attribute and an attribute distance for each attribute and summing the obtained multipliers, the attribute distance being calculated based on the difference between an attribute value of each device in the first device group and an attribute value of each device in the second device groups, wherein the server is configured to calculate a similarity between the first device group and each of the second device groups based on the similarities between each device in the first device group and each device in the second device groups, and wherein the server is configured to extract a first examination rule to be set in the first device group from the second examination rules, which are indicated by the examination information and set in the second device groups, on the calculated similarity between the first device group and each of the second device groups.

2

2. The computer system according to claim 1 , wherein the server is configured to: group the plurality of second device groups into a reference device group and a comparison device group, calculate a percentage that the difference between a sum total of volumes of an event cluster calculated based on physical quantities which a sensor of the comparison device group measures, and a sum total of volumes of an event cluster calculated based on physical quantities which a sensor of the reference device group measures, occupies in the sum total of the volumes of the event cluster calculated based on the physical quantities which the sensor of the reference device group measures, and calculate a similarity coefficient for each attribute based on the calculated percentage and the attribute value included in the sensor information.

3

3. The computer system according to claim 2 , wherein the server is configured to: select a first device from the first device group, select a second device from the second device groups, calculate a similarity between the first device group and the second device groups when a similarity between the first device and the second device is below a first specified threshold, search for one of the second device groups such that a calculated similarity between the first device group and the one second device group is lower than a second specified threshold from the second device groups, and extract the first examination rule to be set in the first device group from the second examination rule set in the one second device group.

4

4. The computer system according to claim 2 , wherein the server is configured to: select a third device adjacent to the first device in the first device group, select a fourth device, when there is a fourth device adjacent to the second device in the second device group, and calculate a similarity between the third device and the fourth device based on the sensor information of devices, select a fifth device adjacent to the third device in the first device group, select a sixth device, when there is a sixth device adjacent to the fourth device in the second device groups, calculate a similarity between the fifth device and the sixth device based on the sensor information of devices, and calculate a similarity between the first device group and each of the second device groups by summing the similarity between the first device and the second device, the similarity between the third device and the fourth device, and the similarity between the fifth device and the sixth device.

5

5. The computer system according to claim 2 , wherein the first and second examination rules contain information relating to an event corresponding to the measured physical quantities, wherein the server is configured to: calculate a volume of range of physical quantities having a high possibility of a particular event occurring as a sum total of volumes of an event cluster of the reference device group, based on information relating to the event corresponding to the reference device group, and calculate a volume of range of physical quantities having a high possibility of another event occurring as a sum total of volumes of an event cluster of the comparison device group, based on information relating to the event corresponding to the comparison device group.

6

6. The computer system according to claim 1 , further comprising a method for processing the physical quantity set in a device belonging to the second device groups in order to examine the physical quantity, wherein the server is configured to extract a first method for processing a physical quantity set in the first device group, from a second method for processing a physical quantity set in the second device groups based on the calculated similarity between the first device group and each of the second device groups.

7

7. The computer system according to claim 1 , wherein the server is configured to: output an event corresponding to a physical quantity measured by a sensor in a specified period based on information relating to an event contained in the examination rule, and acquire information indicating whether or not the information relating to the outputted event requires refreshing, and refresh information relating to the outputted event when refreshing of the information relating to the outputted event is required.

8

8. The computer system according to claim 7 , wherein the server is configured to: acquire the physical quantity measured by the sensor in the specified period, and an event that has occurred in the specified period, and refresh the information relating to the event by way of the acquired physical quantity and event.

9

9. A rule generation method according to a plurality of sensors installed in a plurality of devices to measure specified physical quantities, and a server configured to examine the physical quantities sent from the sensors, the devices being grouped into a first device group and a plurality of second device groups, and the second device groups containing a plurality of second examination rules indicating examination methods for the physical quantities, the server including a processor and a storage device, the server being configured to store, in the storage device, an attribute which indicates types of the plurality of devices and types of the physical quantities measured by the sensors, and storing sensor information of devices, the sensor information including an attribute value of the attribute, regarding the first device group and the second device groups, the server being configured to store, in the storage device, examination information indicating the second examination rules included in the second device groups, the rule generation method comprising steps of: calculating, by the processor, a similarity coefficient of the attribute, calculating, by the processor and by using the sensor information, similarities between each device in the first device group and each device in the plurality of second device groups, by obtaining multipliers from the calculated similarity coefficient of the attribute and an attribute distance for each attribute and summing the obtained multipliers, the attribute distance being calculated based on the difference between an attribute value of each device in the first device group and an attribute value of each device in the second device groups, calculating, by the processor, a similarity between the first device group and each of the second device groups based on a similarity between each device in the first device group and each device in the second device groups; and extracting, by the processor, a first examination rule to be set in the first device group from the second examination rules, which are indicated by the examination information and set in the second device groups, based on the calculated similarity between the first device group and each of the second device groups.

10

10. The rule generation method according to claim 9 , wherein the calculating the similarity coefficient includes: grouping, by the processor, the plurality of second device groups into a reference device group and a comparison device group, calculating, by the processor, a percentage that the difference between a sum total of volumes of an event cluster calculated based on physical quantities which a sensor of the comparison device group measures, and a sum total of volumes of an event cluster calculated based on physical quantities which a sensor of the reference device group measures, occupies in the sum total of the volumes of the event cluster calculated based on the physical quantities which the sensor of the reference device group measures; and calculating, by the processor, a similarity coefficient for each attribute based on the calculated percentage and the attribute value included in the sensor information of devices; wherein the calculating the similarities between each device in the first device group and each device in the second device groups includes: selecting, by the processor, a first device from the first device group, selecting, by the processor, a second device from the second device groups, calculating, by the processor, a similarity between the first device group and the second device groups when a similarity between the first device and the second device is below a first specified threshold value, wherein the extracting the first examination rule includes: searching, by the processor, for one of the second device groups such that a calculated similarity of the first device group and the one second device group is lower than a second specified threshold from the second device groups, and extracting, by the processor, the first examination rule to be set in the first device group from the second examination rule set in the one second device group.

11

11. The rule generation method according to claim 10 , wherein the calculating the similarities between each device in the first device group and each device in the second device groups includes: selecting, by the processor, a third device adjacent to the first device in the first device group; selecting, by the processor, a fourth device when there is a fourth device adjacent to the second devices in the second device group; calculating, by the processor, a similarity between the third device and the fourth device based on the sensor information of devices; selecting, by the processor, a fifth device adjacent to the third device in the first device group; selecting, by the processor, a sixth device when there is a sixth device adjacent to the fourth device in the second device groups; calculating, by the processor, a similarity between the fifth device and the sixth device based on the sensor information of devices; and wherein the calculating the similarity between the first device group and each of the second device groups includes: calculating, by the processor, the similarity between the first device group and each of the second device groups by summing the similarity between the first device and the second device, and the similarity between the third device and the fourth device, and the similarity between the fifth device and the sixth device.

12

12. The rule generation method according to claim 10 , wherein the first and second examination rules contain information relating to an event corresponding to a measured physical quantity, wherein the calculating the similarity coefficient includes: calculating, by the processor, a volume of range of physical quantities having a high possibility of a particular event occurring as a sum total of volumes of an event cluster of the reference device group, based on information relating to the event corresponding to the reference device group, and calculating, by the processor, a volume of range of physical quantities having a high possibility of another event occurring as a sum total of volumes of an event cluster of the comparison device group, based on information relating to the event corresponding to the comparison device group.

13

13. The rule generation method according to claim 9 , wherein a method for processing a physical quantity is set in the second device groups in order to examine the physical quantity; and the extracting the first examination rule includes: extracting, by the processor, a first method for processing a physical quantity to be set in the first device group from a second method for processing a physical quantity set in the second device groups, based on the calculated similarity between the first device group and each of the second device groups.

14

14. The rule generation method according to claim 9 , further comprising: outputting, by the processor, an event corresponding to a physical quantity measured by a sensor in a specified period, based on information relating to an event contained in the examination rule; acquiring, by the processor, information indicating whether refreshing of information relating to the event that has been output is required or not; acquiring, by the processor, an event that has occurred in the specified period, and a physical quantity measured by the sensor in a specified period, when the information relating to the event that has been output must be refreshed; and refreshing, by the processor, information relating to the event by way of the acquired physical quantity and the event.

Patent Metadata

Filing Date

Unknown

Publication Date

February 23, 2016

Inventors

Keiro Muro
Sadaki Nakano

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