Switch Control Unit, Test Apparatus and Method for Liquid Crystal Cell

1. A test method for a liquid crystal cell, comprising: inputting a test signal; modulating the test signal and outputting a gray scale picture signal; and controlling ON and OFF of a gate scan signal by controlling ON and OFF of a control signal input to a gate driver, so as to determine badness positions on a liquid crystal display panel; wherein ON and OFF of said control signal input to the gate driver is controlled by a square wave signal, wherein said control signal is input to said gate driver when said square wave signal is at high level, and said control signal is turned off when said square wave signal is at low level, wherein the gray scale picture signal is input to a source driver while the gate scan signal is being controlled periodically to be ON and OFF, so as to determine the badness positions according to different patterns displayed on the liquid crystal display panel under a status in which the gate scan signal is ON and under a status in which the gate scan signal is OFF respectively.

2. The test method for the liquid crystal cell of claim 1 , wherein said control signal input to said gate driver is a frame-on control signal, periodically controlling ON and OFF of the frame-on control signal input to the gate driver, so as to control ON and OFF of the gate scan signal accordingly; and determining badness positions on the liquid crystal display panel in accordance with a pattern displayed on a screen.

3. The test method for the liquid crystal cell of claim 2 , wherein said periodically controlling ON and OFF of the frame-on control signal input to the gate driver comprises: controlling ON and OFF of the frame-on control signal input to the gate driver by the square wave signal, wherein said frame-on control signal is input to said gate driver when said square wave signal is at high level, and said frame-on control signal is turned off when said square wave signal is at low level.

4. The test method for the liquid crystal cell of claim 3 , wherein a cycle of said square wave signal is larger than that of said frame-on control signal.

5. The test method for the liquid crystal cell of claim 1 , wherein said control signal input to said gate driver comprises high and low level signals generated by a direct current module: controlling ON and OFF of the high and low level signals generated by said direct current module so as to control ON and OFF of the gate scan signal accordingly; and determining badness positions on the liquid crystal display panel in accordance with a pattern displayed on a screen.

6. The test method for the liquid crystal cell of claim 5 , wherein controlling ON and OFF of the high and low level signals generated by said direct current module by the square wave signal; said high and low level signals generated by said direct current module are input to said gate driver when said square wave signal is at high level; and said high and low level signals generated by said direct current module are turned off when said square wave signal is at low level.