Patentable/Patents/US-10024699
US-10024699

Device and method for dynamically measuring an enviromental quality factor

PublishedJuly 17, 2018
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A device and apparatus for measuring and monitoring a domestic environment, include a plurality of sensors (SD11-Snm) for measuring local environmental parameters, a remote source (INFO) of data that can be associated to the environmental quality factor, control elements (CX) for controlling the current conditions of the domestic environment being monitored, further including a programmable electronic processing unit for processing dynamically, via an adaptive algorithm, a current value of the quality factor on the basis of the local-measurement data, of the remote data associated to the quality parameter, and of the local environmental conditions.

Patent Claims

Legal claims defining the scope of protection, as filed with the USPTO.

Claim text for this patent isn't available yet.

Classification Codes (CPC)

Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.

Patent Metadata

Filing Date

March 5, 2013

Publication Date

July 17, 2018

Want to explore more patents?

Browse 5M+ US patents with plain-English claim translations and AI-generated analysis.

Citation & reuse

Analysis on this page is generated by Patentable — an AI-powered patent intelligence platform. AI-generated summaries, explanations, and analysis may be reused with attribution and a visible link back to the canonical URL below. Patent abstracts and claims are USPTO public domain.

Cite as: Patentable. “Device and method for dynamically measuring an enviromental quality factor” (US-10024699). https://patentable.app/patents/US-10024699

© 2026 Patentable. All rights reserved.

Patentable is a research and drafting-assistant tool, not a law firm, and does not provide legal advice. Documents we generate are drafts for review by a licensed patent attorney.