An apparatus for identifying a material within a sample comprising signal generation circuitry generates a first signal including a first orbital angular momentum (OAM) signature and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and identifies the material within the sample based on a detected second orbital angular momentum caused by an interaction of the first signal with chiral molecules within the sample.
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August 15, 2017
August 14, 2018
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