Patentable/Patents/US-10288583
US-10288583

Defect discrimination apparatus, methods, and systems

PublishedMay 14, 2019
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

An apparatus and a system, as well as methods, operable to include acquiring eddy current data from at least two concentric pipes, determining spatial frequency content of the eddy current data, and determining locations of defects in each of the pipes based on the spatial frequency content.

Patent Claims

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Patent Metadata

Filing Date

November 10, 2015

Publication Date

May 14, 2019

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