The disclosure provides a substrate construction applicable to a 3D package, including a silicon substrate for carrying a chip on an upper side thereof, and a circuit structure formed underneath the silicon substrate for being connected to solder balls via conductive pads of the circuit structure, thereby obtaining the same specification of the conductive pads as ball-planting pads of conventional package substrates and avoiding the manufacturing and use of conventional package substrates.
Legal claims defining the scope of protection, as filed with the USPTO.
1. An electronic package, comprising: a silicon-containing substrate including a first side and a second side opposite to the first side; a plurality of conductive pillars formed in the silicon-containing substrate; a circuit structure formed on the first side of the silicon-containing substrate and electrically connected with the conductive pillars, wherein the circuit structure includes a plurality of conductive pads each having a width ranging from 150 μm to 800 μm, and any two of the conductive pads are spaced apart at a distance ranging from 200 μm to 1500 μm; an electronic component provided on the second side of the silicon-containing substrate and electrically connected with the conductive pillars; a first packaging material formed on the silicon-containing substrate and encapsulating the electronic component; and a second packaging material formed on the first packaging material and extending onto a side surface of the silicon-containing substrate and the circuit structure.
2. The electronic package of claim 1 , wherein the circuit structure further includes at least a dielectric layer, a circuit layer formed on the at least a dielectric layer, and a plurality of conductive vias provided in the at least a dielectric layer and electrically connected with the circuit layer.
3. The electronic package of claim 1 , wherein the circuit layer at an outermost side of the circuit structure serves as the conductive pads.
4. The electronic package of claim 1 , wherein the silicon-containing substrate has a length or a width ranging from 3 mm to 125 mm.
5. The electronic package of claim 4 , wherein at least one of the length and the width of the silicon-containing substrate is from 10 mm to 90 mm.
6. The electronic package of claim 1 , wherein the silicon-containing substrate is defined with a through-hole region and a substrate region adjacent to the through-hole region, and wherein the substrate region surrounds the through-hole region, and the conductive pillars are located in the through-hole region.
7. The electronic package of claim 6 , wherein the conductive pads are located in at least one of the through-hole region and the substrate region.
8. The electronic package of claim 6 , wherein an area of the through-hole region with respect to the first side of the silicon-containing substrate is smaller than an area of the substrate region with respect to the first side of the silicon-containing substrate.
9. The electronic package of claim 1 , wherein the distance between the any two of the conductive pads is from 250 μm to 1350 μm, and the width of the conductive pads is from 180 μm to 750 μm.
10. The electronic package of claim 1 , further comprising an insulating protective layer formed on the circuit structure, with the conductive pads exposed from the insulating protective layer.
11. The electronic package of claim 1 , further comprising an insulating protective layer formed on the second side of the silicon-containing substrate, with the conductive pillars exposed from the insulating protective layer.
12. The electronic package of claim 1 , further comprising a circuit portion formed on the second side of the silicon-containing substrate and electrically connected with the conductive pillars.
13. An electronic package, comprising: a silicon-containing substrate including a first side and a second side opposite to the first side; a plurality of conductive pillars formed in the silicon-containing substrate; a circuit structure formed on the first side of the silicon-containing substrate and electrically connected with the conductive pillars, wherein the circuit structure includes a plurality of conductive pads each having a width ranging from 150 μm to 800 μm, and any two of the conductive pads are spaced apart at a distance ranging from 200 μm to 1500 μm; an electronic component provided on the second side of the silicon-containing substrate and electrically connected with the conductive pillars; and a first packaging material of a single continuous structure formed on the silicon-containing substrate and encapsulating the electronic component, wherein the first packaging material is further formed between the second side of the silicon-containing substrate and the electronic component and extends onto an entire lateral side of the silicon-containing substrate and the circuit structure.
14. The electronic package of claim 13 , further comprising an encapsulating layer formed between the second side of the silicon-containing substrate and the electronic component.
15. The electronic package of claim 1 , wherein a portion of a surface of the electronic component is exposed from the first packaging material and the second packaging material.
16. The electronic package of claim 13 , wherein a portion of a surface of the electronic component is exposed from the first packaging material.
17. The electronic package of claim 13 , further comprising a plurality of conductive elements provided on and electrically connected with the conductive pads.
18. The electronic package of claim 13 , wherein the circuit structure further includes at least a dielectric layer, a circuit layer formed on the at least a dielectric layer, and a plurality of conductive vias provided in the at least a dielectric layer and electrically connected with the circuit layer.
19. The electronic package of claim 13 , wherein the circuit layer at an outermost side of the circuit structure serves as the conductive pads.
20. The electronic package of claim 13 , wherein the silicon-containing substrate has a length or a width ranging from 3 mm to 125 mm.
21. The electronic package of claim 20 , wherein at least one of the length and the width of the silicon-containing substrate is from 10 mm to 90 mm.
22. The electronic package of claim 13 , wherein the silicon-containing substrate is defined with a through-hole region and a substrate region adjacent to the through-hole region, and wherein the substrate region surrounds the through-hole region, and the conductive pillars are located in the through-hole region.
23. The electronic package of claim 22 , wherein the conductive pads are located in at least one of the through-hole region and the substrate region.
24. The electronic package of claim 22 , wherein an area of the through-hole region with respect to the first side of the silicon-containing substrate is smaller than an area of the substrate region with respect to the first side of the silicon-containing substrate.
25. The electronic package of claim 13 , wherein the distance between the any two of the conductive pads is from 250 μm to 1350 μm, and the width of the conductive pads is from 180 μm to 750 μm.
26. The electronic package of claim 13 , further comprising an insulating protective layer formed on the circuit structure, with the conductive pads exposed from the insulating protective layer.
27. The electronic package of claim 13 , further comprising an insulating protective layer formed on the second side of the silicon-containing substrate, with the conductive pillars exposed from the insulating protective layer.
28. The electronic package of claim 13 , further comprising a circuit portion formed on the second side of the silicon-containing substrate and electrically connected with the conductive pillars.
29. The electronic package of claim 1 , further comprising an encapsulating layer formed between the second side of the silicon-containing substrate and the electronic component.
30. The electronic package of claim 1 , further comprising a plurality of conductive elements provided on and electrically connected with the conductive pads.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
May 9, 2017
July 23, 2019
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