Semiconductor memory device

1. A semiconductor memory device, comprising: a semiconductor substrate comprising a termination region surrounding a device region thereof, the termination region comprising a first stacked body extending around the device region and including a first layer composed of an insulating material located on a surface of the semiconductor substrate, a second layer composed of a conductive material located over the first layer, and a third layer composed of an insulating material located over the second layer; an opening extending through the first stacked body and extending around the device region; a fourth layer, composed of an insulating material, located in the opening in the first stacked body and over the surface of the semiconductor substrate in the opening; a fifth layer, composed of an insulating material, located over the fourth layer; and a wall surrounding the device region, the wall extending inwardly of the opening and contacting one of the surface of the semiconductor substrate or a nitride material on the surface of the semiconductor substrate, wherein the composition of the third and fifth layers is different from that of the first and fourth layers.

2. The semiconductor memory device according to claim 1 , wherein the wall extends through the fifth layer.

3. The semiconductor memory device according to claim 1 , wherein the fourth layer further comprises an opening therethrough exposing the surface of the semiconductor substrate therein, and the fifth layer extends inwardly of the opening in the fourth layer, and portions of the fifth layer are interposed between both sides of the wall and adjacent portions of the fourth layer.

4. The semiconductor memory device of claim 1 , further comprising a sixth layer, composed of an insulating material, interposed between the fifth layer and a sidewall of the opening in the first stacked body.

5. The semiconductor memory device according to claim 4 , further comprising a seventh layer, composed of an insulating material, overlying the fifth layer.

6. The semiconductor memory device according to claim 5 , further comprising an eighth layer, composed of an insulating material, overlying the fifth layer and at least portions of the fifth layer.

7. The semiconductor memory device according to claim 6 , wherein the wall is spaced from the portion of the eighth layer adjacent thereto.

8. The semiconductor memory device according to claim 1 , wherein the device region includes a memory cell region and a peripheral region interposed between the memory cell region and the termination region, and a second stacked body, having the same composition as the first stacked body, is located in the peripheral region.

9. The semiconductor memory device according to claim 8 , further comprising: a third stacked body comprising a plurality of ninth layers composed of a conductive material stacked one over the other, and located in the device region, wherein an end of the third stacked body includes a stepped portion and portions of individual ones of the ninth layers are not covered by overlying ninth layers.

10. The semiconductor device according to claim 8 , wherein the eighth layer extends over the second stacked body, and a conductive first contact extends therethrough and contacts the second stacked body in the termination region.

11. The semiconductor device according to claim 9 , further comprising: a semiconductor member passing through the third stacked body and connected to the semiconductor substrate; a charge storage member provided between the semiconductor member and the ninth layers; and a conductive second contact contacting a ninth layer at the stepped portion of the third stacked body.