Display quality monitoring and calibration

1. An electronic device, comprising: a processor configured to generate image data and provide the image data to a display; and the display, comprising: a plurality of pixels; source driving circuitry, configured to receive the image data and cause the display to display visual representations by driving the image data to the plurality of pixels to cause the pixels to emit a desired luminance; and data lines that communicatively couple the source driving circuitry with the plurality of pixels; quality monitoring and calibration circuitry, configured to: identify degradation in the source driving circuitry, one or more of the data lines, or both, by measuring one or more signals provided through the data lines from the source driving circuitry, the measuring comprising: performing a resistance test, wherein the resistance test comprises: charging the data lines with a reduced data slewing time by: charging the data lines for a fixed amount of time that is less than an amount of time that would result in a steady charge on the data lines; and determining a resistance variation of the data lines based upon the reduced data slewing time; or identifying distances between the data lines by: driving a first data line of the data lines at a first voltage; driving a neighboring data line of the first data line at a second voltage different than the first voltage; and calculating a mutual capacitance between a first data line and a neighboring data line, based upon a difference in voltage of the first voltage and the second voltage; and control circuitry, configured to: control the electronic device, based at least in part upon identification of the degradation.

2. The electronic device of claim 1 , wherein the quality monitoring and calibration circuitry is configured to identify degradation in the source driving circuitry, one or more of the data lines, or both, by identifying line lengths of the data lines by performing a capacitance test, wherein the capacitance test comprises providing a first and a second charge to the data lines and monitoring a difference in charge between providing the first and the second charges.

3. The electronic device of claim 1 , wherein the quality monitoring and calibration circuitry is configured to attribute the resistance with bonding resistance variation.

4. The electronic device of claim 1 , wherein the quality monitoring and calibration circuitry is configured to attribute the resistance with degradation of the source driving circuitry.

5. The electronic device of claim 1 , comprising a non-transitory storage, wherein the processor causes logging of the degradation in the storage.

6. The electronic device of claim 5 , comprising a non-transitory storage, wherein the processor causes contextual data surrounding the degradation to be logged in the non-transitory storage.

7. The electronic device of claim 1 , wherein the quality monitoring and calibration circuitry is configured to return the display to a powered off state based upon the degradation.

8. The electronic device of claim 1 , wherein the quality monitoring and calibration circuitry is configured to adjust a data line time allotted for sending the data to one or more of the data lines to compensate for the degradation.

9. The electronic device of claim 1 , wherein the quality monitoring and calibration circuitry is configured to adjust a slew rate allotted for reaching a charge to compensate for the degradation.

10. An electronic device-implemented method implemented by quality monitoring and calibration circuitry of the electronic device, comprising: identifying degradation in a source driving circuitry of a display of the electronic device, one or more data lines of the display, or both, based at least in part upon: identifying distances between the data lines, by the electronic device, by: driving a first data line of the one or more data lines at a first voltage; driving a neighboring data line of the first data line at a second voltage different than the first voltage; and calculating a mutual capacitance between a first data line and a neighboring data line, based upon a difference in voltage of the first voltage and the second voltage; or a resistance test, performed by the electronic device, that measures a resistance by charging the data lines with a reduced data slewing time by: charging the data lines for a fixed amount of time that is less than an amount of time that would result in a steady charge on the data lines; and determining a resistance variation of the data lines based upon the reduced data slewing time; and controlling the display, based at least in part upon identification of the degradation; wherein the source driving circuitry is configured to cause the display to display visual representations by driving image data to a plurality of pixels of the display to cause the plurality of pixels to emit a desired luminance, wherein the image data is provided to the source driving circuitry from a processor of the electronic device.

11. The method of claim 10 , comprising identifying the degradation using the resistance test and identification of distances between the data lines.

12. The method of claim 11 , comprising identifying degradation in a source driving circuitry of a display of the electronic device, one or more data lines of the display, or both, based at least in part upon performing a capacitance test by: providing a first charge and a second charge to the one or more data lines and monitoring a difference in change between providing the first charge and the second charge, wherein a first charge for a first data line is different than a first charge for a neighboring data line and wherein a second charge for the first data line is different than a second charge for the neighboring data line; identifying line lengths for the one or more data lines based upon the difference in charge; identifying a distance between the first data line and the neighboring data line based upon the mutual capacitance between the first data line and the neighboring data line; and identifying the degradation based upon the line lengths, the distance between the first data line and the neighboring data line, or both.

13. A tangible, non-transitory, machine-readable medium, comprising machine-readable instructions, that when executed by one or more processors of an electronic device, cause the one or more processors of the electronic device to: generate image data for display by the electronic device; provide the image data to a display of the electronic device; identify degradation in source driving circuitry of a display, one or more data lines of the display, or both based upon: performing a resistance test, wherein the resistance test comprises: charging the data lines with a reduced data slewing time by charging the data lines for a fixed amount of time that is less than an amount of time that would result in a steady charge on the data lines; and determining a resistance variation of the data lines based upon the reduced data slewing time; identifying distances between the data lines based upon a mutual capacitance between neighboring data lines of the one or more data lines, by: driving a first data line of the one or more data lines at a first voltage; driving a neighboring data line of the first data line at a second voltage different than the first voltage; and calculating the mutual capacitance between a first data line and a neighboring data line, based upon a difference in voltage of the first voltage and the second voltage; and Control the display, based at least in part upon identification of the degradation; wherein the source driving circuitry is configured to cause the display to display visual representations by driving image data to a plurality of pixels of the display to cause the plurality of pixels to emit a desired luminance.

14. The machine-readable medium of claim 13 , comprising instructions to: control the display to power off when the degradation breaches a threshold of allowed degradation; control a line time to compensate for added resistance caused by the degradation; control a slew rate to compensate for the degradation when the degradation comprises a slew rate degradation; or any combination thereof.