Patentable/Patents/US-10782224
US-10782224

Spectrum analysis apparatus, fine particle measurement apparatus, and method and program for spectrum analysis or spectrum chart display

PublishedSeptember 22, 2020
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

Provided is a spectrum analysis apparatus including a processing unit configured to generate analysis data using an analysis function in which a linear function and a logarithmic function are included as function elements and an intensity value is set as a variable from measurement data including the intensity value of light acquired by detecting the light from a measurement target object using a plurality of light-receiving elements having different detection wavelength bands.

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Patent Metadata

Filing Date

September 12, 2012

Publication Date

September 22, 2020

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