Integrated circuit controlled ejection system (ICCES) for massively parallel integrated circuit assembly (MPICA)

1. A method of forming a target substrate with a strap-interposer, the method comprising: determining a length of the strap-interposer based on one or more dimensions of an antenna for a target substrate upon which the strap-interposer is to be placed; forming the strap-interposer on the target substrate based on the length; forming a first portion of a common ground testing structure that is electrically coupled to the strap-interposer, the first portion of the common ground testing structure configured to test functionality of an assembly; forming a dielectric structure over the first portion of the common ground test structure and the strap-interposer; and forming a completed target substrate by forming a second portion of the common ground testing structure over the dielectric structure and that is electrically coupled to the strap interposer.

2. The method of claim 1 , further comprising: attaching a die structure to the completed target substrate to complete formation of the assembly; and affixing the completed target substrate across the antenna on another substrate.

3. The method of claim 1 , further comprising: testing functionality of the assembly, marking the assembly as defective, and removing the assembly from a web.

4. The method of claim 1 , wherein the antenna is a coil antenna of a radio frequency identification (RFID) tag that comprises the target substrate.

5. The method of claim 1 , further comprising: a web of antenna strap-interposers that are printed or ablated with respective first portions of common ground test structures.

6. The method of claim 5 , wherein the dielectric structures are printed or ablated over the respective first portions of the common ground structures.

7. The method of claim 6 , further comprising: printing or ablating respective second portions of the common ground structures over the dielectric structures to form completed target substrates upon which die structures are attached.

8. The method of claim 7 , further comprising: forming rolls of completed target substrates that have been successfully tested and individualized.

9. The method of claim 8 , wherein the strap-interposer includes connect pad areas, the method further comprising: applying a lamination of patterned, gummed pressure-sensitive adhesive (PSA) construction that cover portions of the completed target substrates of the rolls and that leave the connecting pad areas of the completed target substrates uncovered.

10. The method of claim 9 , further comprising separating individual ones of the completed target substrates of the rolls the resulting via die-cutting that leaves connections of the common ground testing structure intact.

11. The method of claim 1 , wherein the antenna is configured in a pattern for incorporation into security features of at least one of currency, postage stamps, or tax stamps, or into product labels.

12. The method of claim 1 , wherein the antenna is incorporated into product labels, or wherein the antenna is incorporated into materials of a roll that comprise the substrate.

13. The method of claim 1 , wherein the method is performed by an integrated circuit-controlled ejection system (ICCES) for massively parallel integrated circuit assembly (MPICA).

14. A target substrate with a strap-interposer assembled according to the method of claim 1 .

15. An integrated circuit-controlled ejection system (ICCES) for massively parallel integrated circuit assembly (MPICA) configured to form a target substrate with a strap-interposer, the ICCES comprising: a first formation device configured to form the strap-interposer on the target substrate based on one or more dimensions of an antenna for the target substrate; a second formation device configured to form a first portion of a common ground testing structure that is electrically coupled to the strap-interposer, the common ground testing structure configured to test functionality of an assembly; a third formation device configured to form a dielectric structure over the first portion of the common ground test structure and the strap-interposer; a fourth formation device configured to form a completed target substrate by forming a second portion of the common ground testing structure over the dielectric structure and that is electrically coupled to the strap interposer; and a placement device configured to attach a die structure to the completed target substrate to complete formation of an assembly.