Patentable/Patents/US-10925694
US-10925694

Method for selecting implant components

PublishedFebruary 23, 2021
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

Methods of selecting or designing an implant to be used in a patient are provided. A CT scan of a patient's mouth is performed. A 3D CAD model of the patient's mouth is created utilizing data generated by the CT scan. Properties of the patient's mouth are determined based upon CT scan data and assigned to the 3D CAD model. A desired location for an implant is selected. A FEA simulation is performed on the 3D CAD model to choose an implant or to design an implant that optimizes a selected variable.

Patent Claims
10 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A method of verifying a finite element analysis (FEA) modeling, the method comprising: creating a 3D CAD model of a calibration sample; determining properties of the calibration sample; assigning the determined properties of the calibration sample to the 3D CAD model; selecting a desired location for an implant; performing an FEA simulation of the implant being installed in the calibration sample with the 3D CAD model; measure data from actual placement of the implant into the calibration sample; compare the measured data with the FEA simulation.

2

2. The method of claim 1 , further including: performing a CT scan of the calibration material.

3

3. The method of claim 2 , wherein the properties of the calibration sample are known properties.

4

4. The method of claim 1 , wherein performing the FEA simulation is a real-time simulation of placing the implant into the calibration sample.

5

5. The method of claim 1 , further including: installing the implant into the calibration material.

6

6. The method of claim 5 , wherein the implant is installed into the calibration material using a test fixture that measures the data during the placement of the implant into the calibration sample.

7

7. The method of claim 6 , wherein the data includes 1) a torque required to install the implant, 2) a stress and strain level of the implant, and 3) a stress and strain level of the calibration sample adjacent to the implant.

8

8. The method of claim 1 , wherein comparing the measured data with the FEA simulation includes: determining whether the FEA simulation accurately predicts the measured data.

9

9. The method of claim 8 , wherein; when the FEA simulation does not accurately predicts the measured data, the method includes: adjusting FEA simulation variables; and reperforming the FEA simulation with the adjusted FEA simulation variables.

10

10. The method of claim 8 , wherein; when the FEA simulation accurately predicts the measured data, the method includes: confirming calibration of the FEA simulation such that the FEA calibration can be used on patients.

Classification Codes (CPC)

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Patent Metadata

Filing Date

July 1, 2019

Publication Date

February 23, 2021

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Cite as: Patentable. “Method for selecting implant components” (US-10925694). https://patentable.app/patents/US-10925694

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Method for selecting implant components — Bruce Berckmans, III | Patentable