Aging detector for an electrical circuit component, method for monitoring an aging of a circuit component, component and control device

1. An aging detector, comprising: at least one input for recording an aging specific parameter of a circuit component; wherein the aging detector is for use with an evaluation unit and is configured to perform the following: based on the recorded aging specific parameter, at least one of determining and adapting at least one of a corresponding response and a corresponding response threshold of the response; and initiating the response responsive to the recorded parameter exceeding the response threshold; wherein a type of the response is defined or adapted at adaptation time points, wherein the aging specific parameter includes a measurement curve, wherein the evaluation unit communicates bi-directionally with the aging detector, and wherein the evaluation unit communicates bi-directionally with a control device.

2. The aging detector of claim 1 , wherein the recorded parameter is at least one of a frequency and a duration of a component-critical application of the circuit component.

3. The aging detector of claim 1 , further comprising: at least one output, wherein the detector is configured to apply a voltage to the at least one output and to record an electrical resistance or a threshold voltage drift in response to the application of the voltage.

4. The aging detector of claim 3 , wherein, based on the electrical resistance, the detector is configured to monitor an electro-migration of a metal oxide semiconductor transistor (MOS transistor) induced by a negative bias voltage.

5. The aging detector of claim 3 , wherein, based on the threshold voltage drift, the detector is configured to monitor a temperature instability effect (NBTI effect) of a metal oxide semiconductor transistor (MOS transistor) induced by a negative bias voltage.

6. A method for monitoring an aging of an electrical circuit component, the method comprising: determining, via an aging detector, at least one aging specific parameter; based on the recorded aging specific parameter, at least one of determining and adapting, via the aging detector, at least one of a corresponding response and a corresponding response threshold of the response; and initiating the response responsive to the recorded parameter exceeding the response threshold; wherein a type of the response is defined or adapted at adaptation time points, wherein the aging specific parameter includes a measurement curve, wherein an evaluation unit communicates bi-directionally with the aging detector, and wherein the evaluation unit communicates bi-directionally with a control device.

7. The method of claim 6 , further comprising: recording manufacturing data when manufacturing the circuit component and using the manufacturing data to adapt at least one of the response threshold and the response.

8. A system, comprising: a circuit component; and a plurality of aging detectors; and an evaluation unit, which communicates bi-directionally with each of the aging detectors; wherein each of the aging detectors includes at least one input for recording an aging specific parameter of a circuit component, wherein the aging detector is configured to perform the following: based on the recorded aging specific parameter, at least one of determining and adapting at least one of a corresponding response and a corresponding response threshold of the response; and initiating the response responsive to the recorded parameter exceeding the response threshold; wherein a type of the response is defined or adapted at adaptation time points, and wherein the aging specific parameter includes a measurement curve, and wherein the evaluation unit communicates bi-directionally with a control device.