Patentable/Patents/US-11329091
US-11329091

Solid-state image pickup unit, method of manufacturing solid-state image pickup unit, and electronic apparatus

PublishedMay 10, 2022
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A back-illuminated type solid-state image pickup unit in which a pad wiring line is provided on a light reception surface and which is capable of improving light reception characteristics in a photoelectric conversion section by having a thinner insulating film in a pixel region. The solid-state image pickup unit includes a sensor substrate having a pixel region in which photoelectric conversion sections are formed in an array, and a drive circuit is provided on a surface opposed to a light reception surface for the photoelectric conversion sections of the sensor substrate. A through hole via reaching the drive circuit from the light reception surface of the sensor substrate is provided in a peripheral region located outside the pixel region. A pad wiring line directly laminated on the through hole via is provided on the light reception surface in the peripheral region.

Patent Claims
33 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A light-detecting device, comprising: a sensor substrate having a pixel region in which photoelectric conversion sections are arranged in an array; a circuit on a surface opposed to a light reception surface for the photoelectric conversion sections of the sensor substrate; a through hole via in a peripheral region located outside the pixel region and extending to the circuit from the light reception surface of the sensor substrate; a pad wiring line on the light reception surface in the peripheral region; and an insulating layer disposed opposite the light-receiving surface from the pad wiring line, wherein the insulating layer has a first thickness corresponding to the peripheral region and a second thickness corresponding to the pixel region, wherein the first thickness is different than the second thickness, wherein the pad wiring line is disposed above the first thickness of the insulating layer, wherein a light reception opening is disposed above the second thickness of the insulating layer, and wherein a portion of a light reception surface of the pad wiring line is exposed.

2

2. The light-detecting device according to claim 1 , further comprising: a protective film provided on the light reception surface to cover the pad wiring line; an on-chip lens provided on the protective film; and a pad opening provided in the protective film to expose the pad wiring line.

3

3. The light-detecting device according to claim 1 , wherein a device is disposed in a position superimposed on the pad wiring line on the surface of the sensor substrate.

4

4. The light-detecting device according to claim 1 , wherein the through hole via includes an embedded wiring portion provided at the light reception surface of the sensor substrate and a through hole via portion formed integrally with the embedded wiring portion, and the pad wiring line is directly laminated on the embedded wiring portion.

5

5. The light-detecting device according to claim 4 , wherein the embedded wiring portion is embedded on the light reception surface of the sensor substrate.

6

6. The light-detecting device according to claim 1 , wherein a light-shielding film having light reception openings corresponding to the photoelectric conversion sections is provided on the light reception surface in the pixel region, and the pad wiring line and the light-shielding film are configured of a same layer.

7

7. The light-detecting device according to claim 1 , further comprising: a light-shielding film having light reception openings corresponding to the photoelectric conversion sections, wherein the light-shielding film is provided on the second thickness, and wherein the pad wiring line is provided on the first thickness.

8

8. The light-detecting device according to claim 1 , wherein the insulating layer has a laminate structure formed from a plurality of different materials, and a film of an upper layer portion of the laminate structure is removed in the pixel region.

9

9. The light-detecting device according to claim 1 , wherein a circuit substrate comprising a drive circuit is bonded to the surface of the sensor substrate.

10

10. The light-detecting device according to claim 1 , wherein a light-receiving surface side of the second thickness is closer to the sensor substrate than a light-receiving surface side of the first thickness.

11

11. The light-detecting device according to claim 10 , further comprising: a protective film provided on the light reception surface to cover the pad wiring line; and a pad opening provided to the protective film to expose the pad wiring line.

12

12. The light-detecting device according to claim 11 , further comprising: an on-chip lens provided on the protective film.

13

13. The light-detecting device according to claim 10 , wherein a device is disposed in a position superimposed on the pad wiring line on the surface of the sensor substrate.

14

14. The light-detecting device according to claim 10 , wherein the through hole via includes an embedded wiring portion provided at the light reception surface of the sensor substrate and a through hole via portion formed integrally with the embedded wiring portion, and the pad wiring line is directly laminated on the embedded wiring portion.

15

15. The light-detecting device according to claim 14 , wherein the embedded wiring portion is embedded on the light reception surface of the sensor substrate.

16

16. The light-detecting device according to claim 10 , wherein a light-shielding film having light reception openings corresponding to the photoelectric conversion sections is provided on the light reception surface in the pixel region, and the pad wiring line and the light-shielding film are configured of a same layer.

17

17. The light-detecting device according to claim 10 , further comprising: a light-shielding film having light reception openings corresponding to the photoelectric conversion sections, wherein the light-shielding film is provided on the second thickness, and the pad wiring line is provided on the first thickness.

18

18. The light-detecting device according to claim 10 , wherein the insulating layer has a laminate structure formed from a plurality of different materials, and a film of an upper layer portion of the laminate structure is removed in the pixel region.

19

19. The light-detecting device according to claim 10 , wherein a circuit substrate comprising a drive circuit is bonded to the surface of the sensor substrate.

20

20. The light-detecting device according to claim 1 , wherein a distance from the sensor substrate to a light-receiving surface side of the second thickness is less than a distance from the sensor substrate to a light-receiving surface side of the first thickness.

21

21. The light-detecting device according to claim 20 , further comprising: a protective film provided on the light reception surface to cover the pad wiring line; an on-chip lens provided on the protective film; and a pad opening provided to the protective film to expose the pad wiring line.

22

22. The light-detecting device according to claim 20 , wherein a device is disposed in a position superimposed on the pad wiring line on the surface of the sensor substrate.

23

23. The light-detecting device according to claim 20 , wherein the through hole via includes an embedded wiring portion provided at the light reception surface of the sensor substrate and a through hole via portion formed integrally with the embedded wiring portion, and the pad wiring line is directly laminated on the embedded wiring portion.

24

24. The light-detecting device according to claim 23 , wherein the embedded wiring portion is embedded on the light reception surface of the sensor substrate.

25

25. The light-detecting device according to claim 20 , wherein a light-shielding film having light reception openings corresponding to the photoelectric conversion sections is provided on the light reception surface in the pixel region, and the pad wiring line and the light-shielding film are configured of a same layer.

26

26. The light-detecting device according to claim 20 , further comprising: a light-shielding film having light reception openings corresponding to the photoelectric conversion sections, wherein the light-shielding film is provided on the second thickness, and the pad wiring line is provided on the first thickness.

27

27. The light-detecting device according to claim 20 , wherein the insulating layer has a laminate structure formed from a plurality of different materials, and a film of an upper layer portion of the laminate structure is removed in the pixel region.

28

28. The light-detecting device according to claim 20 , wherein a circuit substrate comprising a drive circuit is bonded to the surface of the sensor substrate.

29

29. The light-detecting device according to claim 1 , wherein the pad wiring line is directly connected with an external wiring.

30

30. The light-detecting device according to claim 1 , wherein the sensor substrate and the circuit substrate are bonded such that a first wiring of the sensor substrate and a second wiring of the circuit substrate face each other.

31

31. The light-detecting device according to claim 30 , wherein the first wiring and the second wiring are electrically connected by the through hole via.

32

32. The light-detecting device according to claim 1 , wherein the exposed portion of the light reception surface of the pad wiring layer is in the peripheral region.

33

33. An electronic apparatus, comprising: a light-detecting device comprising: a sensor substrate having a pixel region in which photoelectric conversion sections are arranged in an array; a circuit on a surface opposed to a light reception surface for the photoelectric conversion sections of the sensor substrate; a through hole via in a peripheral region located outside the pixel region and extending to the circuit from the light reception surface of the sensor substrate; a pad wiring line on the light reception surface in the peripheral region; and an insulating layer disposed opposite the light-receiving surface from the pad wiring line, wherein the insulating layer has a first thickness corresponding to the peripheral region and a second thickness corresponding to the pixel region, wherein the first thickness is different than the second thickness, wherein the pad wiring line is disposed above the first thickness of the insulating layer, wherein a light reception opening is disposed above the second thickness of the insulating layer, and wherein a portion of a light reception surface of the pad wiring line is exposed.

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Patent Metadata

Filing Date

May 15, 2019

Publication Date

May 10, 2022

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Cite as: Patentable. “Solid-state image pickup unit, method of manufacturing solid-state image pickup unit, and electronic apparatus” (US-11329091). https://patentable.app/patents/US-11329091

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