Patentable/Patents/US-11451314
US-11451314

Measurement method and measurement system

PublishedSeptember 20, 2022
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A measurement method includes providing a test signal to a first signal path and to a second signal path within a predefined time interval, thereby obtaining a first signal and a second signal, respectively; consecutively modifying at least one of a phase and an amplitude of the first signal and of the second signal, thereby obtaining a first modified signal and a second modified signal, respectively; applying a first window at least to the first signal, thereby obtaining a first set of measurement data being associated with at least the first signal; applying a second window at least to the second signal, thereby obtaining a second set of measurement data being associated with at least the second signal; and determining a response function difference between the signal paths based on the first set of measurement data and the second set of measurement data. Further, a measurement system is described.

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Patent Metadata

Filing Date

July 24, 2020

Publication Date

September 20, 2022

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