A technique includes determining, via an analog circuit, where an access rate of a memory row associated with a memory device exceeds a threshold. In various examples, upon a determination that the access rate exceeds the threshold, the technique may further comprise generating an alert to indicate possible corruption of data stored in an adjacent row to the memory row.
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11. The system of claim 6, wherein each of the plurality of analog circuits further comprises a plurality of transistors and a logic gate.
12. The system of claim 11, wherein a logic of the logic gate is based on use of a high or low logic to generate a signal indicative of the word line being accessed at least at the predetermined rate.
14. The system of claim 13, wherein a reset voltage from the bandpass filter is connected to the gate of the first FET and a source voltage from the bandpass filter is connected to the second FET and the first FET.
18. The article of claim 15, wherein the indication is received when an access rate of the word line associated with the memory device exceeds 3.1e6 accesses per 64 milliseconds.
20. The article of claim 15, wherein the integrator determines that the respective word line has been accessed at least at the predetermined rate when the pulses associated with the positive transitions of the word line access signals exceed a predetermined threshold.
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April 30, 2013
October 18, 2022
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