Patentable/Patents/US-11501031
US-11501031

Method for calculating processing parameters for residual stress control by parameter inversion

PublishedNovember 15, 2022
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

The present invention belongs to the field of processing residual stress, and discloses a method for calculating processing parameters for residual stress control by parameter inversion. This method comprises: (a) extracting a characteristic index reflecting the residual stress distribution characteristic from a residual stress distribution curve; (b) respectively presetting initial values of processing parameters for residual stress control, calculating an initial value of the characteristic index, and drawing curves of the characteristic index over the respective processing parameters to obtain respective fitted curves; (c) respectively establishing a relation formula between respective characteristic index increment of the processing parameters and the fitting curve; and (d) assigning the values and performing inversion calculation to obtain the required processing parameters. The present invention is simple in operation, reduces the number of tests, lowers the production cost, improves the processing residual stress distribution of the workpiece and improves the anti-fatigue life of the components.

Patent Claims
10 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The method of claim 1, wherein the characteristic index includes the maximum surface residual stress, the maximum residual compressive stress depth in the surface layer or the depth of the surface tensile stress layer.

3

3. The method of claim 1, wherein in the step (b), the processing parameters include cutting speed, feed rate, cutting depth, tool edge radius or tool rake angle.

4

4. The method of claim 1, wherein the initial value H(a10, a20, . . . , ai0, . . . , an0) of the characteristic index is calculated by a residual stress analytical model or experimentally measured.

5

5. The method of claim 1, wherein in the step (b), the drawn curves of the characteristic index over the respective processing parameters Ai are obtained by a processing residual stress theoretical model or experimental measurements.

6

6. The method of claim 2, wherein in the step (b), the processing parameters include cutting speed, feed rate, cutting depth, tool edge radius or tool rake angle.

7

7. The method of claim 2, wherein the initial value H(a10, a20, . . . , ai0, . . . , an0) of the characteristic index is calculated by a residual stress analytical model or experimentally measured.

8

8. The method of claim 3, wherein the initial value H(a10, a20, . . . , ai0, . . . , an0) of the characteristic index is calculated by a residual stress analytical model or experimentally measured.

9

9. The method of claim 2, wherein in the step (b), the drawn curves of the characteristic index over the respective processing parameters Ai are obtained by a processing residual stress theoretical model or experimental measurements.

10

10. The method of claim 3, wherein in the step (b), the drawn curves of the characteristic index over the respective processing parameters Ai are obtained by a processing residual stress theoretical model or experimental measurements.

11

11. The method of claim 4, wherein in the step (b), the drawn curves of the characteristic index over the respective processing parameters Ai, are obtained by a processing residual stress theoretical model or experimental measurements.

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Patent Metadata

Filing Date

April 2, 2019

Publication Date

November 15, 2022

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