According to an embodiment, the invention relates to a computer implemented method for grading a pattern from a first size to a second size, the pattern comprising one or more panels, the method comprising the steps of a representation step comprising representing each panel of the one or more panels by a contour, wherein a contour comprises one or more segments, a constraint step comprising imposing constraints on segments for grading to the second size; generating a mesh of each panel of the one or more panels thereby obtaining a first set of meshes; combining the first set of meshes with the constraints into a system of equations; solving the system of equations into a second set of meshes, wherein the contours of the second meshes correspond to the pattern in the second size and representing the contours of the second set of meshes.
Legal claims defining the scope of protection, as filed with the USPTO.
2. The computer implemented method according to claim 1, wherein the determining the one or more contours of the second set of meshes further comprises approximating the one or more contours by parametric curves.
4. The computer implemented method according to claim 3, wherein the one or more contours of the one or more panels are represented by parametric curves comprising the one or more characteristic points.
9. The computer implemented method according to claim 1, wherein the solving the system of equations into the second set of meshes further comprises minimizing a deformation energy of the second set of meshes with respect to the first set of meshes.
10. The computer implemented method according to claim 1, wherein the solving the system of equations into the second set of meshes further comprises morphing the first set of meshes into the second set of meshes.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
December 6, 2018
December 13, 2022
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