Patentable/Patents/US-11566888
US-11566888

Systems and methods for automatic measurement and scanning of complex surfaces

PublishedJanuary 31, 2023
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

Systems and methods are provided for collecting measurement data for a three-dimensional object. In embodiments, a computer model of the three-dimensional object is generated that correlates points on the three-dimensional object with points in three-dimensional space; the computer model is used to collect measurement data of the three-dimensional object and associate the collected measurement data with points in three-dimensional space; and a plan view computer model of the three-dimensional object is generated that depicts the measurement data in two dimensions and that associates the depicted measurement data with points in three-dimensional space.

Patent Claims
9 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The computer-implemented method of claim 1, wherein the computer model of the three-dimensional object is a two-dimensional texture model of the surface of the three-dimensional object.

7

7. The computer-implemented method of claim 6, wherein the collected measurement data is populated into the grid cells of the plan view computer model.

8

8. The computer-implemented method of claim 7, wherein the collected measurement data is ultrasonic measurement data, and the ultrasonic measurement data is populated into the grid cells of the plan view computer model to generate a C-Scan image.

9

9. The computer-implemented method of claim 7, wherein the plan view computer model associates the grid cells with positions in three-dimensional space.

11

11. The system of claim 10, wherein the computer model of the three-dimensional object is a two-dimensional texture model of the surface of the three-dimensional object.

16

16. The system of claim 15, wherein scanning software instructions are further configured to populate the collected measurement data into the grid cells of the plan view computer model.

17

17. The system of claim 16, wherein the collected measurement data is ultrasonic measurement data, and the ultrasonic measurement data is populated into the grid cells of the plan view computer model to generate a C-Scan image.

18

18. The system of claim 16, wherein the plan view computer model associates the grid cells with positions in three-dimensional space.

20

20. The non-transitory computer readable medium of claim 19, wherein the computer model of the three-dimensional object is a two-dimensional texture model of the surface of the three-dimensional object.

Classification Codes (CPC)

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Patent Metadata

Filing Date

September 17, 2020

Publication Date

January 31, 2023

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Cite as: Patentable. “Systems and methods for automatic measurement and scanning of complex surfaces” (US-11566888). https://patentable.app/patents/US-11566888

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