Patentable/Patents/US-11940463
US-11940463

Particle measurement device, three-dimensional shape measurement device, prober device, particle measurement system, and particle measurement method

PublishedMarch 26, 2024
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

The particle measurement device includes: an acquiring unit configured to acquire pad surface shape data indicating a surface shape of an electrode pad including a probe needle mark where a probe needle has contacted; a roughness calculating unit configured to calculate volume of a recessed portion recessed from a pad reference surface and volume of a protruding portion protruding from the pad reference surface based on the pad surface shape data; and a particle quantity calculating unit configured to calculate a particle quantity from a volume difference between the volume of the recessed portion and the volume of the protruding portion.

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Patent Metadata

Filing Date

August 31, 2023

Publication Date

March 26, 2024

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Cite as: Patentable. “Particle measurement device, three-dimensional shape measurement device, prober device, particle measurement system, and particle measurement method” (US-11940463). https://patentable.app/patents/US-11940463

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