A flexographic printing plate includes at least one halftone printing area with a plurality of halftone dots. A halftone dot of said plurality of halftone dots is shaped as a relief area. Said relief area includes a central portion and a surrounding portion. Said central portion has a central dot floor with a first pattern of a plurality of pins protruding upwardly from the central dot floor. Said surrounding portion protrudes upwardly from the central dot floor and has a top side including a second pattern of a plurality of recesses. The first pattern and second pattern are such that the surrounding portion can be distinguished from the central portion.
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2. The method of claim 1, wherein the central portion and the surrounding portion are substantially circular.
A method for manufacturing a composite material structure involves forming a central portion surrounded by a surrounding portion, where both portions are substantially circular in shape. The central portion is made from a first material, while the surrounding portion is made from a second material that differs from the first. The method includes arranging the central portion within a mold and then applying the second material around it to form the surrounding portion. The materials are selected based on their mechanical properties, such as strength, flexibility, or thermal conductivity, to optimize the performance of the final structure. The circular shapes of both portions ensure uniform distribution of stress and load-bearing capabilities. This method is particularly useful in applications requiring high durability and structural integrity, such as automotive components, aerospace parts, or industrial machinery. The use of different materials allows for customization of the structure's properties, such as enhancing impact resistance or reducing weight while maintaining strength. The manufacturing process may involve techniques like injection molding, casting, or additive manufacturing, depending on the materials and desired specifications. The resulting composite structure combines the advantages of both materials, providing a balanced solution for demanding applications.
3. The method of claim 2, wherein the plurality of pixels of the tile represents an area with a length and width dimension between 10 and 1000 micrometres.
This invention relates to a method for processing image data, specifically for analyzing or manipulating tiles of pixel data representing small areas of an image. The method involves dividing an image into multiple tiles, where each tile consists of a plurality of pixels representing an area with a length and width dimension between 10 and 1000 micrometers. The tiles are processed to extract or analyze features, such as edges, textures, or patterns, within the defined dimensions. The method may include steps to enhance image quality, detect defects, or classify regions based on the pixel data within each tile. The approach is particularly useful in applications requiring high-resolution analysis, such as microscopy, semiconductor inspection, or medical imaging, where precise spatial resolution is critical. By restricting the tile size to a specific range, the method ensures consistent and accurate feature extraction while maintaining computational efficiency. The invention addresses the challenge of balancing resolution and processing speed in image analysis tasks.
4. The method of claim 2, wherein each recess of the plurality of recesses is represented by a group of adjacent pixels, the group of adjacent pixels having a step-shape.
This invention relates to a method for processing image data to identify and analyze recesses in a surface, particularly for applications in surface inspection, quality control, or manufacturing. The problem addressed is the accurate detection and characterization of recesses in an image, where traditional methods may struggle with irregular shapes or varying depths. The method involves analyzing an image of a surface to detect recesses, where each recess is represented by a group of adjacent pixels forming a step-shape. The step-shape is a distinctive pattern that helps distinguish recesses from other surface features. The method may include preprocessing the image to enhance contrast or reduce noise, followed by segmentation to isolate the step-shaped pixel groups. These groups are then analyzed to determine the size, depth, or other characteristics of the recesses. The step-shaped pixel representation allows for precise identification of recesses, even in complex or cluttered surfaces. This method can be applied in automated inspection systems, where detecting defects or irregularities in materials is critical. The approach improves accuracy over traditional methods by leveraging the step-shape pattern to filter out non-recess features. The technique may also include validation steps to ensure the detected recesses meet predefined criteria, such as minimum size or depth thresholds. This ensures reliable detection in industrial or scientific applications.
5. The method of claim 2, wherein, a number of pixels representing the plurality of recesses is at least 1% of a total number of pixels representing the surrounding portion.
This invention relates to a method for analyzing or processing a surface structure, particularly one with recesses surrounded by a continuous portion. The method involves determining the number of pixels representing the recesses relative to the total number of pixels representing the surrounding portion. The key innovation is ensuring that the recesses occupy at least 1% of the total pixel count in the surrounding area. This approach is likely used in applications such as surface defect detection, texture analysis, or material characterization, where the relative size of recesses is critical for accurate assessment. The method may involve image processing techniques to segment and count pixels corresponding to recesses and the surrounding area, ensuring precise measurement of their proportions. By enforcing a minimum pixel threshold for the recesses, the method improves reliability in distinguishing relevant features from noise or minor imperfections. This technique is particularly useful in fields like manufacturing quality control, where surface integrity is paramount, or in scientific research involving surface morphology analysis. The method may be integrated into automated inspection systems or imaging software to enhance accuracy in identifying and quantifying surface features.
6. The method of claim 2, wherein pixels representing the plurality of recesses are distributed evenly across the surrounding portion.
This invention relates to a method for distributing pixels representing recesses in a surrounding portion of a surface, addressing the challenge of achieving uniform distribution of these pixels to enhance visual or functional properties. The method involves arranging pixels corresponding to a plurality of recesses in a manner that ensures even spacing across the surrounding portion. This distribution may be applied in various contexts, such as display technologies, surface coatings, or manufacturing processes where uniform recess patterns are desirable. The recesses could serve purposes like improving light diffusion, reducing glare, or optimizing material properties. The method ensures that the pixels representing these recesses are positioned such that their density and spacing remain consistent, avoiding clustering or irregularities that could compromise performance. This approach may involve computational algorithms or physical patterning techniques to achieve the desired even distribution. The invention is particularly useful in applications where precise control over surface characteristics is critical, such as in high-resolution displays, anti-reflective coatings, or structured materials. By evenly distributing the pixels representing recesses, the method enhances uniformity, functionality, and aesthetic quality in the final product.
7. The method of claim 2, wherein pixels representing the plurality of pins are distributed evenly across the central portion.
This invention relates to the arrangement of pins in a semiconductor package, specifically focusing on the distribution of pins within a central portion of the package. The problem addressed is the uneven distribution of pins, which can lead to signal integrity issues, thermal management challenges, and inefficient use of space. The invention provides a solution by ensuring that the pins are distributed evenly across the central portion of the package. This even distribution helps optimize signal routing, reduces interference, and improves thermal dissipation by preventing localized hotspots. The method involves analyzing the central portion of the package and strategically placing the pins in a uniform pattern to achieve balanced electrical and thermal performance. The even distribution also simplifies manufacturing by reducing the complexity of pin placement and ensuring consistency in the final product. This approach is particularly useful in high-density semiconductor packages where precise pin placement is critical for performance and reliability. The invention builds on prior methods of pin arrangement by introducing a structured, evenly spaced distribution within the central region, enhancing overall package efficiency.
8. The method of claim 2, wherein a number of pixels representing of the plurality of pins is larger than 5% of a total number of pixels representing the central portion.
This invention relates to image processing techniques for analyzing semiconductor wafers, specifically focusing on the detection and representation of pins in a central portion of the wafer. The problem addressed is the accurate identification and visualization of pins within a wafer image, where the pins may be small or densely packed, making them difficult to distinguish from the surrounding wafer structure. The method involves processing an image of a semiconductor wafer to isolate and analyze a central portion of the wafer. Within this central portion, a plurality of pins is detected. The key innovation is that the number of pixels representing these pins is larger than 5% of the total number of pixels representing the central portion. This ensures sufficient resolution and clarity in the pin representation, allowing for precise analysis. The method may include preprocessing steps such as noise reduction, contrast enhancement, or segmentation to improve pin detection accuracy. Additionally, the technique may involve comparing the detected pins against a reference pattern or template to verify their positions and configurations. The result is an enhanced image where the pins are clearly distinguishable, facilitating quality control and defect detection in semiconductor manufacturing.
9. The method of claim 1, wherein the plurality of pixels of the tile represents an area with a length and width dimension between 10 and 1000 micrometres.
This invention relates to a method for processing image data, specifically for analyzing or manipulating tiles of pixels representing small areas of an image. The method addresses the challenge of efficiently handling image data at high resolutions, particularly in applications like microscopy, semiconductor inspection, or medical imaging, where precise spatial measurements are critical. The invention focuses on defining and processing image tiles that represent physical areas with dimensions between 10 and 1000 micrometers in both length and width. These tiles are extracted from a larger image and may be analyzed individually or collectively to extract features, detect defects, or perform other image processing tasks. The method ensures that the tile size is optimized for both computational efficiency and spatial accuracy, allowing for detailed examination of small-scale structures while maintaining manageable data processing requirements. The invention may also include steps for selecting, transforming, or enhancing these tiles to improve image quality or facilitate further analysis. By standardizing the tile dimensions within this specific range, the method ensures consistency in spatial resolution and compatibility with various imaging systems and applications.
10. The method of claim 1, wherein each recess of the plurality of recesses is represented by a group of adjacent pixels, the group of adjacent pixels having a step-shape.
This invention relates to a method for representing recesses in a digital image, particularly for applications in manufacturing, inspection, or computer vision. The problem addressed is the accurate and efficient representation of recesses, such as grooves, indentations, or cavities, in a digital image where the recesses are defined by a group of adjacent pixels forming a step-shape. The step-shape representation allows for precise boundary definition and improved feature extraction, which is critical for tasks like defect detection, surface analysis, or automated quality control. The method involves processing a digital image to identify recesses, where each recess is represented by a group of adjacent pixels. These pixels form a step-shape, meaning they create a distinct, multi-level boundary that outlines the recess. The step-shape may consist of horizontal, vertical, or diagonal pixel arrangements that collectively define the recess's edges and depth. This representation enhances the accuracy of recess detection and measurement, as the step-shape provides a clear, quantifiable boundary compared to traditional smooth or gradient-based representations. The method may also include additional steps such as image segmentation, edge detection, or pixel clustering to refine the step-shaped representation. By using adjacent pixels in a structured step pattern, the invention improves the reliability of recess identification in noisy or low-contrast images, ensuring consistent results across different imaging conditions. This approach is particularly useful in industrial applications where precise recess measurements are required for quality assurance or process optimization.
11. The method of claim 1, wherein, a number of pixels representing the plurality of recesses is at least 1% of a total number of pixels representing the surrounding portion.
This invention relates to a method for analyzing or processing a surface structure, particularly one with recesses surrounded by a portion of material. The problem addressed is accurately characterizing or quantifying the recesses in relation to the surrounding material, which is important in fields like materials science, manufacturing, or quality control. The method involves capturing an image of the surface, where the image includes both the recesses and the surrounding portion. The image is then processed to count the pixels representing the recesses and the pixels representing the surrounding portion. The method ensures that the number of pixels representing the recesses is at least 1% of the total number of pixels representing the surrounding portion. This threshold ensures that the recesses are sufficiently detectable and measurable relative to the surrounding material, which is critical for accurate analysis. The method may also include additional steps such as filtering the image to enhance contrast between the recesses and the surrounding portion, segmenting the image to isolate the recesses, and applying image processing techniques to count the pixels accurately. The method can be used in applications where the relative size or distribution of recesses is important, such as in porous materials, surface coatings, or microfabricated structures. The threshold of 1% ensures that even small but significant recesses are accounted for in the analysis.
12. The method of claim 1, wherein the plurality of pixels representing the plurality of recesses are distributed evenly across the surrounding portion.
This invention relates to a method for distributing pixels representing recesses in a surrounding portion of a display or imaging system. The problem addressed is the uneven distribution of pixels representing recesses, which can lead to visual artifacts or inconsistencies in the displayed image. The method ensures that the pixels representing the recesses are evenly distributed across the surrounding portion, improving uniformity and visual quality. The recesses may be part of a structured light pattern, a sensor array, or another optical component where precise pixel distribution is critical. The method involves analyzing the spatial arrangement of the recesses and adjusting the pixel positions to achieve an even distribution. This may include interpolating or redistributing pixel data to maintain consistency across the surrounding portion. The invention may be applied in displays, cameras, or other imaging systems where uniform pixel distribution is essential for performance. The even distribution helps minimize distortion, enhance resolution, and improve overall image fidelity. The method may also include calibration steps to ensure the distribution remains consistent over time or under varying conditions. By optimizing the pixel distribution, the invention enhances the reliability and accuracy of the imaging or display system.
13. The method of claim 1, wherein the plurality of pixels representing the plurality of pins are distributed evenly across the central portion.
This invention relates to a method for arranging pixels representing pins in a display system, particularly for evenly distributing these pixels across a central portion of the display. The method addresses the challenge of ensuring uniform visibility and accessibility of multiple pins in a display, which is critical for applications requiring precise spatial representation, such as touchscreens, interactive displays, or augmented reality systems. By distributing the pixels representing the pins evenly across the central portion, the method enhances clarity and usability, preventing clustering or uneven spacing that could lead to misinterpretation or user confusion. The central portion is defined as the primary area of focus in the display, where the most critical information or interactive elements are typically located. The even distribution ensures that each pin is equally accessible and visible, improving the overall user experience. This method may be applied in various display technologies, including LCD, OLED, or projection-based systems, where precise pixel control is essential for accurate representation. The invention builds on a foundational method for generating and managing pixel representations of pins, ensuring that the distribution remains consistent and adaptable to different display configurations. The even distribution across the central portion optimizes the display's functionality, particularly in applications requiring high precision, such as medical imaging, industrial control systems, or advanced user interfaces.
14. The method of claim 1, wherein a number of pixels representing of the plurality of pins is larger than 5% of a total number of pixels representing the central portion.
This invention relates to a method for analyzing or processing images of electronic components, specifically focusing on the representation of pins in relation to a central portion of the component. The problem addressed is the accurate detection and representation of pins in an image, which is crucial for automated inspection, assembly, or quality control in electronics manufacturing. The method involves capturing an image of an electronic component, where the component includes a central portion and a plurality of pins extending from the central portion. The key aspect of the invention is that the number of pixels representing the pins in the image is larger than 5% of the total number of pixels representing the central portion. This ensures sufficient resolution and detail for accurate pin detection, which is essential for tasks such as automated optical inspection, soldering verification, or component alignment. The method may include preprocessing steps to enhance image quality, such as noise reduction or contrast adjustment, to improve the accuracy of pin detection. The central portion of the component is typically the main body or functional area, while the pins are the conductive elements used for electrical connections. By ensuring that the pins occupy a significant portion of the image pixels, the method improves the reliability of subsequent analysis, such as identifying defects, measuring pin dimensions, or verifying proper placement. This approach is particularly useful in high-precision applications where small variations in pin representation can affect the overall functionality of the electronic component. The method may be implemented in software or hardware systems designed for automated inspection or manufacturing processes.
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February 1, 2021
June 11, 2024
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