Patentable/Patents/US-12024652
US-12024652

Polishing composition and method of polishing a substrate having enhanced defect reduction

PublishedJuly 2, 2024
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

An aqueous alkaline chemical mechanical polishing composition includes a quaternary ammonium compound having a phenyl group which enables enhanced reduction of defects on silicon oxide substrates and enables good silicon oxide removal rates during chemical mechanical polishing.

Patent Claims
2 claims

Legal claims defining the scope of protection, as filed with the USPTO.

2

2. The method of chemical mechanical polishing a substrate of claim 1, wherein the quaternary ammonium compound has the following formula (I):, wherein R1, R2 and R3 are independently selected from the group consisting of C1-C2 alkyl and X− is selected from the group consisting of Br−, Cl− and OH−.

5

5. The method of claim 1, wherein the quaternary ammonium compound is selected from the group consisting of phenyltrimethylammonium chloride, phenyltrimethylammonium bromide, phenyltrimethylammonium hydroxide and mixtures thereof.

Classification Codes (CPC)

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Patent Metadata

Filing Date

October 13, 2022

Publication Date

July 2, 2024

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