Optical inspection device

An optical inspection device 1A includes a light selection unit 30, a detection element 40, and a first image formation element 20. The light selection unit 30 has the plurality of wavelength selection regions 32 that selectively transmits or reflects the light rays L of mutually different wavelength regions. The detection element 40 detects scattering characteristic information of the light rays L having reached the light receiving surface 41 via the light selection unit 30. The first image formation element 20 causes scattered light scattered by a subject S to enter a light receiving surface 41 via the light selection unit 30. The plurality of wavelength selection regions 32 has different azimuth angles with respect to the optical axis z of the first image formation element 20.