A member for a semiconductor manufacturing apparatus, includes: a ceramic plate that has a ceramic plate through hole; an electroconductive base plate that has a base plate through hole and that is disposed on a lower surface side of the ceramic plate; an insulating sleeve which is inserted into the base plate through hole and of which an outer peripheral surface is adhered to an inner peripheral surface of the base plate through hole via an adhesion layer; and a sleeve through hole that passes through the insulating sleeve in the up-down direction and that communicates with the ceramic plate through hole. The insulating sleeve has a tool engaging portion that is engageable with an external tool, and upon being engaged with the external tool, the tool engaging portion transmits rotation torque of the external tool to the insulating sleeve.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A member for a semiconductor manufacturing apparatus, comprising: a ceramic plate that has a wafer placement surface on an upper surface and that has an electrode embedded therein; a ceramic plate through hole that passes through the ceramic plate in an up-down direction; a base plate that has electroconductivity and that is disposed on a lower surface side of the ceramic plate; a base plate through hole that passes through the base plate in the up-down direction; an insulating sleeve which is inserted into the base plate through hole and of which an outer peripheral surface is adhered to an inner peripheral surface of the base plate through hole via an adhesion layer; and a sleeve through hole that passes through the insulating sleeve in the up-down direction and that communicates with the ceramic plate through hole, wherein the insulating sleeve has a tool engaging portion that is engageable with an external tool, and upon being engaged with the external tool, the tool engaging portion transmits rotation torque of the external tool to the insulating sleeve.
2. The member for a semiconductor manufacturing apparatus according to claim 1, wherein the base plate has a refrigerant flow path embedded therein, and the tool engaging portion is provided downward from a bottom surface of the refrigerant flow path.
3. The member for a semiconductor manufacturing apparatus according to claim 2, wherein a lower end of the adhesion layer is situated at a height that is same as or downward from the bottom surface of the refrigerant flow path and that is upward from the tool engaging portion.
4. The member for a semiconductor manufacturing apparatus according to claim 1, wherein the tool engaging portion is a female screw thread portion provided in the sleeve through hole, a male screw thread portion provided on the outer peripheral surface of the insulating sleeve, or a plurality of slit grooves provided along the up-down direction from a lower end of the insulating sleeve.
5. The member for a semiconductor manufacturing apparatus according to claim 1, wherein a cross section of the sleeve through hole, taken in the tool engaging portion along a plane that is parallel to the wafer placement surface, is a polygon, a shape of a circle provided with a protruding portion or a recessed portion, or a shape in which a circle is cut away along two parallel chords.
6. The member for a semiconductor manufacturing apparatus according to claim 1, wherein an outer shape of a cross section of the insulating sleeve, taken in the tool engaging portion along a plane that is parallel to the wafer placement surface, is a polygon, a shape of a circle provided with a protruding portion or a recessed portion, or a shape in which a circle is cut away along two parallel chords.
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February 16, 2023
January 28, 2025
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