Heating device and heating method for semiconductor thermal process

1. A heating device for a semiconductor thermal process, comprising: a first heating portion, on which a wafer to-be-heated is placed; a second heating portion, wherein the first heating portion and the second heating portion are arranged in parallel, and the second heating portion is configured to heat the first heating portion; and an adjustment portion, configured to adjust a vertical distance between the first heating portion and the second heating portion; wherein the heating device further comprises a wafer holder, and the wafer holder is arranged on a side of the first heating portion away from the second heating portion; and the wafer is mounted on the wafer holder, wherein the wafer holder comprises a telescopic unit, and the telescopic unit is configured to adjust a height of the wafer holder.

2. The heating device for a semiconductor thermal process according to claim 1, wherein the adjustment portion comprises an adjustment bracket, and the first heating portion is connected to the adjustment bracket; and the adjustment bracket drives the first heating portion to move toward or away from the second heating portion.

3. The heating device for a semiconductor thermal process according to claim 2, wherein the adjustment bracket comprises a support unit parallel to the first heating portion, an adjustment unit perpendicular to the support unit is arranged on an edge of the support unit, and the adjustment unit is connected to the first heating portion; when the adjustment unit retracts, the first heating portion moves toward the second heating portion; and when the adjustment unit extends, the first heating portion moves away from the second heating portion.

4. The heating device for a semiconductor thermal process according to claim 1, wherein the adjustment portion comprises a first driving unit, the first driving unit is connected to the second heating portion, and the first driving unit drives the second heating portion to move toward or away from the first heating portion.

5. The heating device for a semiconductor thermal process according to claim 1, wherein the heating device further comprises a driving unit, and the driving unit is connected to the second heating portion; and the driving unit is configured to drive the second heating portion to rotate.

6. The heating device for a semiconductor thermal process according to claim 1, wherein the heating device further comprises a cover, the cover is connected to the first heating portion, and a thermal cavity is formed between the first heating portion and the cover.

7. The heating device for a semiconductor thermal process according to claim 6, wherein the cover is provided with an air inlet channel and an air outlet channel; and, the air inlet channel is communicated with an external gas storage device, and inert gas is stored in the external gas storage device.

8. The heating device for a semiconductor thermal process according to claim 1, wherein the second heating portion comprises a heating element; and the heating element comprises multiple heating subunits, and the multiple heating subunits are distributed asymmetrically.

9. The heating device for a semiconductor thermal process according to claim 1, wherein a material of the first heating portion comprises ceramic.

10. The heating device for a semiconductor thermal process according to claim 1, wherein a material of the second heating portion comprises metal.