Panel Inspection Device

This application claims priority to Chinese Patent Application No. CN 202410602440.8 filed on May 15, 2024, the disclosures of which are incorporated herein in their entirety by reference.

The present invention relates to a panel inspection device, and more particularly refers to a panel inspection device capable of adjusting probe positions and sharing a backlight module.

Prior to packaging, a liquid crystal display (LCD) panel must undergo inspection operations (e.g., light-up tests) by inputting power and control signals to drive the LCD panel, allowing observation of whether the display state of the LCD panel meets the required standards. To inspect large quantities of LCD panels, the LCD panels will be subjected to inspection operations by means of an inspection fixture. However, the contact positions of LCD panels with different specifications (sizes) may not be identical. Therefore, the inspection fixture must be designed with probe specifications and positions for matching LCD panels with different specifications in order to drive them properly. Additionally, the backlight module of the inspection fixture cannot be shared among LCD panels with different specifications, necessitating the construction of different inspection fixtures according to the LCD panel specifications.

In view of the above, the present invention, according to some embodiments, provides a panel inspection device comprising an inspection plate, a carrier plate, a backlight module, a bracket assembly, and a first probe assembly. The inspection plate has a first edge and a second edge. The carrier plate is disposed on the inspection plate, forming an opening with the first edge and the second edge. The backlight module corresponds to the opening. The bracket assembly comprises a first bracket, which is disposed on the first edge and includes a first sliding groove. The first probe assembly includes a plurality of first probes. The first probe assembly is slidably disposed in the first sliding groove and is movable between a first position and a second position. When the first probe assembly is in the second position, the first probes correspond to the inner side of the first edge.

According to some embodiments, the panel inspection device further comprises a detection housing and an actuating assembly. The detection housing is connected to the inspection plate. The actuating assembly connects the detection housing and the bracket assembly, wherein when actuated, the first probe is positioned on the inner side of the first edge.

According to some embodiments, the actuating assembly comprises a first elastic component, a linkage assembly, and an operating member. The first elastic component is supported between the detection housing and the first bracket and is configured to produce telescopic motion when actuated. The linkage assembly connects the detection housing and the first bracket. The operating member is connected to the linkage assembly, wherein when actuated, the linkage assembly actuates the first elastic component.

According to some embodiments, the first probe assembly further comprises a first probe base. The first probe base has a first adjustment sliding groove and a first adjustment screw. The first adjustment screw is disposed within the first sliding groove and the first adjustment sliding groove. The first sliding groove has a first adjustment direction, and the first adjustment sliding groove has a second adjustment direction, with the first adjustment direction being perpendicular to the second adjustment direction.

According to some embodiments, the first probe assembly further comprises a first connecting plate. The first probes are fixed to the first connecting plate, and the first connecting plate is detachably assembled to the first probe base.

According to some embodiments, the bracket assembly further comprises a second bracket and a second probe assembly. The second bracket is disposed on the second edge and includes a second sliding groove. The second probe assembly comprises a plurality of second probes. The second probe assembly is slidably disposed in the second sliding groove and is movable between a third position and a fourth position. When the second probe assembly is in the fourth position, the second probes correspond to the inner side of the second edge.

According to some embodiments, the actuating assembly further comprises a second elastic component. The second elastic component is supported between the detection housing and the second bracket and is configured to produce telescopic motion when actuated. The linkage assembly connects the detection housing, the first bracket, and the second bracket. The operating member is connected to the linkage assembly, wherein when actuated, the linkage assembly actuates the first elastic component and the second elastic component.

According to some embodiments, the second probe assembly further comprises a second probe base. The second probe base has a second adjustment sliding groove and a second adjustment screw. The second adjustment screw is disposed within the second sliding groove and the second adjustment sliding groove. The second sliding groove has a third adjustment direction, and the second adjustment sliding groove has a fourth adjustment direction, with the third adjustment direction being perpendicular to the fourth adjustment direction.

According to some embodiments, the second probe assembly further comprises a second connecting plate. The second probes are fixed to the second connecting plate, and the second connecting plate is detachably assembled to the second probe base.

According to some embodiments, the panel inspection device further comprises a movable baffle. The movable baffle is slidably disposed on the inspection plate. When actuated, the movable baffle is positioned on the inner side of the first edge. In summary, according to some embodiments of the present invention, a panel inspection device is provided wherein, during inspection, a display panel can be supported on the carrier plate. The first probe assembly, corresponding to the specifications of the display panel, is adjusted to the signal transmission portion of the display panel by sliding in the first sliding groove of the first bracket. When the first probes contact the signal transmission portion, the display mode of the display panel can be controlled to perform the inspection. The carrier plate can support display panels of various sizes, and the inspection light generated by the backlight module is suitable as a backlight source for display panels with different sizes, illuminating the display panel through the opening to inspect the display state of the panel. In some embodiments, when the signal transmission portions of the display panel are located at both the first edge and the second edge, the first probe assembly can be adjusted to the signal transmission portion located at the first edge by sliding in the first sliding groove of the first bracket. The second probe assembly can be adjusted to the signal transmission portion located at the second edge by sliding in the second sliding groove of the second bracket. This allows the panel inspection device to measure and control the display panel using both the first probe assembly and the second probe assembly.

Wherein, the numerals and symbols used in the drawings are listed as following.

Please refer totogether.is a perspective view of a panel inspection device according to some embodiments of the present invention.is an exploded view of the panel inspection device according to some embodiments of the present invention.is a top view of the panel inspection device according to some embodiments of the present invention.is a schematic diagram showing the panel inspection device inspecting a display panel according to some embodiments of the present invention. As shown in, in some embodiments, the panel inspection devicecomprises an inspection plate, a carrier plate, a backlight module, a bracket assembly, and a first probe assembly. The inspection platehas a first edgeand a second edge. The carrier plateis disposed on the inspection plate, forming an openingwith the first edgeand the second edge. The backlight modulecorresponds to the opening. The bracket assemblycomprises a first bracket, which is disposed on the first edgeand includes a first sliding groove. The first probe assemblyincludes multiple first probes. The first probe assemblyis slidably disposed in the first sliding grooveand is movable between a first position and a second position. When the first probe assemblyis in the second position, the first probescorrespond to the inner side of the first edge.

The panel inspection deviceis used for performing an inspection operation on a display panel. During the inspection operation, the panel inspection devicecan transmit a control signal to the display panelvia the first probe assembly, causing the display panelto generate a corresponding display mode (e.g., transparent, opaque, or partially transparent) according to the control signal.

As further shown in, the inspection platehas a first surfaceand a second surface. The bracket assemblyand the first probe assemblyare disposed on the first surface. In some embodiments, the inspection platehas a light-transmitting aperture. The first edgemay refer to the long side of the light-transmitting aperture, and the second edgemay refer to the short side of the light-transmitting aperture. However, this is not limiting; the first edgecould also be the short side, and the second edgecould be the long side. In some embodiments, the light-transmitting aperturemay be an open aperture (e.g., a U-shaped aperture) or a closed aperture. In the embodiment shown in, the light-transmitting apertureis a closed aperture, with the first edgebeing the long side of the light-transmitting apertureand the second edgebeing the short side.

As shown in, the carrier plateis used to support the display panel. The carrier platemay be fixed to the first surfaceor embedded within the light-transmitting aperture. The phrase “the carrier plateis disposed on the inspection plateto form the openingwith the first edgeand the second edge” may refer to the scenario where the carrier plateis fixed to the first surface, with the part of the light-transmitting aperturenot covered by the carrier plateforming the opening. It may also refer to the scenario where the carrier plateis embedded within the opening, with the portion of the light-transmitting aperturethat penetrates through the carrier plateforming the opening. During the inspection operation, the display panelcan be supported on the opening, with the backlight modulecorresponding to the position of the display panel.

In some embodiments, when the openingis a closed aperture, the display panelcan rest on the inner side of the opening(with the display panelpositioned between the first surfaceand the second surface). In some embodiments, the size of the openingcan correspond to the maximum size of the display panel, allowing the openingto support the largest or smaller size of display panel. During the inspection operation, the display panelcan abut both the first edgeand the second edgeon the same side, and the part of the openingnot covered by the display panelcan be shielded (as will be described later). In some embodiments, the area of the openingis substantially equal to the area of the display panel. When the display panelis supported on the opening, light leakage can be reduced or prevented. It should be noted that if display panelswith different sizes are to be inspected, the carrier platethat matches the size of the display panelcan be replaced on the inspection plate.

The backlight moduleis used to generate inspection light when driven. The backlight modulemay be disposed on the second surfaceof the inspection plate, such that the backlight modulecorresponds to the openingand emits inspection light towards the opening. In this way, the inspection light can serve as a backlight source for the display panelto check whether the display state of the display panelmeets the inspection standards.

The bracket assemblyis disposed on the first surfaceand can move the first probe assemblyso that the first probesare electrically connected to at least one signal transmission portionof the display panel. When the first bracketis disposed on the first edge, the first sliding grooveextends along the X-axis direction in, allowing the first probe assemblyto move along the X-axis direction in the first sliding groove. If the signal transmission portionsof display panelswith different sizes are located at different positions along the X-axis, the first probe assemblycan be adjusted in the X-axis direction via the first sliding grooveso that the first probescorrespond to the signal transmission portions. In some embodiments, the first bracketmay extend from the outer side of the first edgetowards the inner side of the first edge, such that the signal transmission portioncorresponds to the position of the first sliding groove. In some embodiments, the first bracketmay also be disposed on the second edge, and multiple first bracketsmay be disposed on both the first edgeand the second edge(as will be described later).

The phrase “the first probescorrespond to the inner side of the first edge” may refer to the first probescorresponding to the signal transmission portionlocated on the inner side of the first edge. When the first probescontact the signal transmission portion, the first probe assemblycan transmit control signals via the first probesto the signal transmission portion. In some embodiments, the second position may refer to the position where the first probesand the signal transmission portionare aligned on a plumb line (as shown in). Conversely, the first position may refer to other positions of the first probesin the first sliding groove.

As further shown in, in some embodiments, the panel inspection devicefurther comprises a detection housingand an actuating assembly. The detection housingis connected to the inspection plate. The actuating assemblyconnects the detection housingand the bracket assembly. When actuated, the actuating assemblypositions the first probeson the inner side of the first edge, allowing the first probesto contact the signal transmission portion. It should be noted that before actuation, the first probesare distant from the signal transmission portion. After actuation, the first probescontact the signal transmission portion. In some embodiments, the signal generating deviceand/or the signal analyzing devicemay be housed in the detection housing(as will be described inlater).

Reference to.illustrate side views of the panel inspection device in some embodiments of the present invention. Specifically,shows the position of the linkage assembly prior to actuation, whiledepicts the position after actuation.

As shown in, in some embodiments, the actuating assemblyincludes a first elastic component, a linkage assembly, and an operating member. The first elastic componentis supported between the detection housingand the first bracket. When actuated, it generates a telescopic movement.

The telescopic movement refers to the state where, prior to actuation, the first elastic componenthas a first length (as shown in, the length of the first elastic componentalong the Y-axis). After actuation, it has a second length (as shown in, the length of the first elastic componentalong the Y-axis), wherein the first length is greater than the second length.

The linkage assemblyconnects the detection housingand the first bracket. The operating memberis connected to the linkage assemblyand, when actuated, the linkage assemblyactuates the first elastic component, causing the first elastic componentto shorten from the first length to the second length.

It should be noted that, when the first elastic componentis at the first length, the first probeis positioned away from the signal transmission portion(as further shown in). When the first elastic componentis at the second length, the first probemakes contact with the signal transmission portion ().

The first elastic componentmay be implemented as a spring sleeve, a hydraulic rod, or a pneumatic rod.

Further reference to. In some embodiments, as illustrated in, the linkage assemblymay be implemented as a linkage group. For example, the linkage assemblyincludes a first connecting rod, a second connecting rod, and a third connecting rodsequentially connected. The first connecting rodand the third connecting rodare connected to the second surfaceof the inspection plate.

When the operating memberis not actuated, the second connecting rodmaintains a first distance Dfrom the first bracket, with the first elastic componentin its first length. Upon actuation of the operating member, the second connecting rodtransitions to a second distance Dfrom the first bracket, compressing the first elastic componentto its second length. The first distance Dis greater than the second distance D.

In other words, the distance between the second connecting rodand the first bracketchanges from the first distance Dto the second distance D, causing the first bracketto move closer to the inspection plate. At the second distance D, the first probemakes contact with the signal transmission portion.

Further Reference to. In some embodiments, as shown in, the first probe assemblyfurther includes a first probe base. The first probe baseis equipped with a first adjustment sliding grooveand a first adjustment screw. The first adjustment screwis positioned within both the first sliding grooveand the first adjustment sliding groove.

The first sliding groovedefines a first adjustment direction (e.g., along the X-axis in), while the first adjustment sliding groovedefines a second adjustment direction (e.g., along the Z-axis in). The first adjustment direction is perpendicular to the second adjustment direction.

Thus, the first probe basecan be moved between a first position and a second position along the first sliding grooveby adjusting the first adjustment screw, effectively changing the position of the first probe basealong the Y-axis in. Additionally, the first probe basecan be adjusted along the Z-axis inby altering its position relative to the first adjustment screwthrough the first adjustment sliding groove. This enables the first probeto align with the signal transmission portion.

In some embodiments, the first probe assemblyfurther comprises a first connecting plate, where the first probesare fixed to the first connecting plate, and the first connecting plateis detachably assembled to the first probe base. It should be noted that the configuration of the signal transmission portionof display panelswith different sizes may be the same or different. For example, for an 8-inch display panel, the contact width of the signal transmission portionmay be 1020 μm, and the contact distance may be 480 μm (as shown by the multiple contactsof the signal transmission portionin). Corresponding to the specifications of the signal transmission portion, the probe spacing of each first probeon the first probe basemay be 1500 μm. Among 8-inch, 12.25-inch, and 12.3-inch display panels, the specifications of the signal transmission portionare the same. Therefore, when inspecting 8-inch, 12.25-inch, or 12.3-inch display panels, the same specification of the first connecting platecan be assembled to the first probe basewithout replacing the first connecting plate. For example, for a 9-inch display panel, the contact width of the signal transmission portionmay be 460 μm, and the contact distance may be 330 μm. Corresponding to the specifications of the signal transmission portion, the probe spacing of each first probeon the first probe basemay be 790 μm. Therefore, if the object to be inspected changes from an 8-inch display panelto a 9-inch display panel, the corresponding specification of the first connecting platecan be replaced on the first probe baseto match the contact specifications of the 9-inch display panel.

Please refer to.is an enlarged view of areaA in, showing the first probe corresponding to the first sub-transmission portion.is an enlarged view of areaB in, showing the second probe corresponding to the second sub-transmission portion. As shown in, in some embodiments, the signal transmission portioncomprises a first sub-transmission portionand a second sub-transmission portion. The first sub-transmission portionis adjacent to the first edge, and the second sub-transmission portionis adjacent to the second edge. In some embodiments, the bracket assemblyfurther comprises a second bracketand a second probe assembly. The second bracketis disposed on the second edgeand includes a second sliding groove. The second probe assemblycomprises multiple second probes. The second probe assemblyis slidably disposed in the second sliding grooveand is movable between a third position and a fourth position. When the second probe assemblyis in the fourth position, the second probescorrespond to the inner side of the second edge. Thus, the first probe assemblycan correspond to the first sub-transmission portion, and the second probe assemblycan correspond to the second sub-transmission portion. During the inspection operation, the panel inspection devicecan transmit control signals to the first sub-transmission portionvia the first probe assemblyand/or to the second sub-transmission portionvia the second probe assembly. In some embodiments, the first probe assemblyand the second probe assemblycan receive control signals separately.

As shown in, in some embodiments, the structure of the second bracketand the second probe assemblymay be the same as that of the first bracketand the first probe assembly. The description of the first bracketand the first probe assemblymentioned above can be referenced. The difference from the previous embodiments is that the second position may refer to the position where the first probeand the first sub-transmission portionare aligned on a plumb line, while the first position may refer to other positions of the first probein the first sliding groove. The fourth position may refer to the position where the second probeand the second sub-transmission portionare aligned on a plumb line, while the third position may refer to other positions of the second probein the second sliding groove.

In some embodiments, when the actuating assemblyis actuated, the first probeis positioned on the inner side of the first edge, and the second probeis positioned on the inner side of the second edge. It should be noted that the actuating assemblycan synchronously or asynchronously bring the first probeinto contact with the first sub-transmission portionand the second probeinto contact with the second sub-transmission portion(as will be explained later).

In some embodiments, the actuating assemblyfurther comprises a second elastic component. The second elastic componentis supported between the detection housingand the second bracket. The linkage assemblyconnects the detection housing, the first bracket, and the second bracket. The operating memberis connected to the linkage assembly. When the operating memberis actuated, the linkage assemblyactuates the first elastic componentand the second elastic component, shortening the first elastic componentand the second elastic componentto the second length. Thus, the first bracketconnected to the first elastic componentand the second bracketconnected to the second elastic componentcan be simultaneously driven, causing the first probeto contact the first sub-transmission portionand the second probeto contact the second sub-transmission portion. The structure of the second elastic componentcan be the same as that of the first elastic component, and the description of the first elastic componentmentioned above can be referenced.

In some embodiments, the second probe assemblyfurther comprises a second probe base. The second probe basehas a second adjustment sliding grooveand a second adjustment screw. The second adjustment screwis positioned in the second sliding grooveand the second adjustment sliding groove. The second sliding groovehas a third adjustment direction (as shown by the Z-axis in), and the second adjustment sliding groovehas a fourth adjustment direction (as shown by the X-axis in), with the third adjustment direction being perpendicular to the fourth adjustment direction. Thus, the second probe basecan be moved to the third position or the fourth position in the second sliding grooveby the second adjustment screw(i.e., adjusting the position of the second probe baseon the Z-axis in). The second probe basecan also be moved relative to the second adjustment screwin the second adjustment sliding groove(i.e., adjusting the position of the second probe baseon the X-axis in), so that the second probecorresponds to the second sub-transmission portion.

In some embodiments, the second probe assemblyfurther comprises a second connecting plate. The second probesare fixed to the second connecting plate. The second connecting plateis detachably assembled to the second probe base. It should be noted that the specifications (e.g., probe spacing) of the second probeson the second connecting platemay be the same as those of the first probeson the first connecting plate. Alternatively, the first connecting plateor the second connecting platemay be selected according to the specifications of the first sub-transmission portionor the second sub-transmission portionof the display panel.

In some embodiments, when the area of the openingis larger than the area of the display panel, an uncovered area may be formed between the openingand the display panel. A light-shielding plate (not shown in the figure) can be provided in the uncovered area to block light leakage. As shown in, in some embodiments, the panel inspection devicefurther comprises a movable baffle. The movable baffleis slidably disposed on the inspection plate. When actuated, the movable baffleis positioned on the inner side of the first edge. When the display panelis supported on the carrier plateand the movable baffleis actuated, the movable bafflecan move from the outer side of the first edgeto the inner side of the first edgeto cover a portion of the display panel. The movable bafflecan act as a stop for the display panel, keeping the display panelsupported on the carrier plate. It can also block the uncovered area to prevent light leakage. The movable bafflecan be disposed on the first edgeor the second edge(as shown in, where the movable baffleis disposed on the first edge). Alternatively, multiple movable bafflescan be respectively disposed on both the first edgeand the second edge. In some embodiments, the panel inspection devicefurther comprises another movable baffle. The other movable baffleis pivotally disposed on the inspection plate. When actuated, the other movable baffleis positioned on the inner side of the first edgeand the inner side of the second edgeto cover a portion of the display panel.

Please refer to.is a block diagram of the panel inspection device, the signal generating device, and the signal analyzing device according to some embodiments of the present invention. As shown in, the control signal can be sent to the panel inspection devicevia a detection signal generating device. The first probe assemblycan be connected to the detection signal generating devicevia a signal line to receive the control signal. In some embodiments, a signal analyzing deviceis electrically connected to the display panelto capture a feedback signal generated by the display panelin response to the control signal and to obtain an inspection result based on the feedback signal. In some embodiments, the inspection operation includes an open test or a short test. For example, in an open test, if the measured feedback signal is greater than a standard value, the result is determined to be a pass. Conversely, if the measured feedback signal is less than the standard value, the result is determined to be a fail. Similarly, in a short test, if the measured feedback signal is greater than the standard value, the result is determined to be a fail. Conversely, if the measured feedback signal is less than the standard value, the result is determined to be a pass. The feedback signal can be, for example, one or a combination of working voltage (VDD), gate high voltage (VGH), gate low voltage (VGL), common voltage (VCOM), and source waveform signals.

In summary, according to some embodiments of the present invention, a panel inspection deviceis provided, wherein during the inspection operation, the display panelcan be supported on the carrier plate. The first probe assembly, corresponding to the specifications of the display panel, is adjusted to the signal transmission portionof the display panelby sliding in the first sliding grooveof the first bracket. When the first probescontact the signal transmission portion, the display mode of the display panelcan be controlled to perform the inspection operation. The carrier platecan support display panelswith different sizes, and the inspection light generated by the backlight moduleis suitable as a backlight source for display panelswith different sizes, illuminating the display panelthrough the openingto inspect the display state of the display panel. In some embodiments, when the signal transmission portionof the display panelis located at both the first edgeand the second edge, the first probe assemblycan be adjusted to correspond to the first sub-transmission portionby sliding in the first sliding grooveof the first bracket. The second probe assemblycan be adjusted to correspond to the second sub-transmission portionby sliding in the second sliding grooveof the second bracket. Thus, the panel inspection devicecan measure and control the display panelusing both the first probe assemblyand the second probe assembly.