Sample-and-hold circuit having reduced amplifier offset effects and related methods

1. An integrated sample-and-hold (S/H) circuit for an input signal and comprising: a substrate; a first sampling capacitor formed on said substrate; a first field-effect transistor (FET) formed on said substrate and having a first conduction terminal for receiving the input signal, a second conduction terminal connected to said first sampling capacitor, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during a sampling time and for disconnecting the input signal from said first sampling capacitor during a holding time, said first FET further comprising a body creating a parasitic diode-connected to said first sampling capacitor; a first buffer amplifier having an input connected to said first sampling capacitor and an output connected to the body of said first FET during the holding time for applying a holding voltage from said first sampling capacitor to the body of said first FET to thereby reduce undesired effects from the parasitic diode, said first buffer amplifier having a direct current (D.C.) offset; and amplifier offset compensation means for compensating for the D.C. offset of said first buffer amplifier.

2. An integrated S/H circuit according to claim 1 wherein said amplifier offset compensation means comprises: offset determining means for determining an offset voltage generated by said first buffer amplifier; and offset correction means for generating an offset correction signal responsive to said offset determining means and coupling the offset correction signal to said first buffer amplifier.

3. An integrated S/H circuit according to claim 2 wherein said first buffer amplifier comprises a pair of inputs; and wherein said offset determining means comprises means for connecting both inputs to the input voltage during a portion of the sampling time.

4. An integrated S/H circuit according to claim 2 wherein said offset determining means comprises storing means for storing the offset voltage of said first buffer amplifier.

5. An integrated S/H circuit according to claim 4 wherein said storing means comprises a second sampling capacitor and a second buffer amplifier connected thereto.

6. An integrated S/H circuit according to claim 5 wherein said offset correction means further comprises a differential amplifier having a first input connected to said second sampling capacitor, a second input connected to a reference voltage, and a pair of differential outputs connected to said first buffer amplifier.

7. An integrated S/H circuit according to claim 1 wherein said amplifier offset compensation means comprises null sample means for sampling the offset voltage during a null time occurring during a portion of the sample time.

8. An integrated S/H circuit according to claim 7 wherein said null sample means comprises means for sampling the offset voltage during a null time of less than about 10 microseconds.

9. An integrated S/H circuit according to claim 1 further comprising subthreshold conduction current compensation means for reducing undesired effects of subthreshold conduction current in said first FET during the holding time.

10. An integrated S/H circuit according to claim 9 wherein said subthreshold conduction current compensation means comprises means for causing a voltage at the first conduction terminal of said first FET to be substantially equal to a voltage at the second conduction terminal of the first FET during the holding time.

11. An integrated S/H circuit according to claim 9 further comprising a second FET having a first conduction terminal connected to the input signal, a second conduction terminal connected to the first conduction terminal of said first FET, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during the sampling time and for disconnecting the input signal from said first sampling capacitor during the holding time.

12. An integrated S/H circuit according to claim 11 wherein said subthreshold conduction current compensation means further comprises means for connecting the holding voltage from the output of said first buffer amplifier to a node defined between the second conduction terminal of said second FET and the first conduction terminal of said first FET during the holding time.

13. An integrated S/H circuit according to claim 1 wherein said first buffer amplifier has a gain of substantially one.

14. An integrated S/H circuit according to claim 1 further comprising an output amplifier connected to said first sampling capacitor for generating an output signal based upon the holding voltage on said first sampling capacitor.

15. An integrated S/H circuit according to claim 1 wherein said first buffer amplifier comprises an FET input stage.

16. An integrated sample-and-hold (S/H) circuit for an input signal and comprising: a substrate; a first sampling capacitor formed on said substrate; a first field-effect transistor (FET) formed on said substrate and having a first conduction terminal for receiving the input signal, a second conduction terminal connected to said first sampling capacitor, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during a sampling time and for disconnecting the input signal from said first sampling capacitor during a holding time; a first buffer amplifier having an input connected to said first sampling capacitor and an output connected to the body of said first FET during the holding time for applying a holding voltage from said first sampling capacitor to the body of said first FET, said first buffer amplifier having a direct current (D.C.) offset; offset determining means for determining an offset voltage generated by said first buffer amplifier; and offset correction means for generating an offset correction signal responsive to said offset determining means and coupling the offset correction signal to said first buffer amplifier.

17. An integrated S/H circuit according to claim 16 wherein said first buffer amplifier comprises a pair of inputs; and wherein said offset determining means comprises means for connecting both inputs to the input voltage during a portion of the sampling time.

18. An integrated S/H circuit according to claim 16 wherein said offset determining means comprises storing means for storing the offset voltage of said first buffer amplifier.

19. An integrated S/H circuit according to claim 18 wherein said storing means comprises a second sampling capacitor and a second buffer amplifier connected thereto.

20. An integrated S/H circuit according to claim 19 wherein said offset correction means further comprises a differential amplifier having a first input connected to said second sampling capacitor, a second input connected to a reference voltage, and a pair of differential outputs connected to said first buffer amplifier.

21. An integrated S/H circuit according to claim 16 wherein said amplifier offset compensation means comprises null sample means for sampling the offset voltage during a null time occurring during a portion of the sample time.

22. An integrated S/H circuit according to claim 21 wherein said null sample means comprises means for sampling the offset voltage during a null time of less than about 10 microseconds.

23. An integrated S/H circuit according to claim 16 further comprising subthreshold conduction current compensation means for reducing undesired effects of subthreshold conduction current in said first FET during the holding time.

24. An integrated S/H circuit according to claim 23 wherein said subthreshold conduction current compensation means comprises means for causing a voltage at the first conduction terminal of said first FET to be substantially equal to a voltage at the second conduction terminal of the first FET during the holding time.

25. An integrated S/H circuit according to claim 23 further comprising a second FET having a first conduction terminal connected to the input signal, a second conduction terminal connected to the first conduction terminal of said first FET, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during the sampling time and for disconnecting the input signal from said first sampling capacitor during the holding time.

26. An integrated S/H circuit according to claim 25 wherein said subthreshold conduction current compensation means further comprises means for connecting the holding voltage from the output of said first buffer amplifier to a node defined between the second conduction terminal of said second FET and the first conduction terminal of said first FET during the holding time.

27. An integrated S/H circuit according to claim 16 wherein said first buffer amplifier comprises an FET input stage.

28. An integrated sample-and-hold (S/H) circuit for an input signal and comprising: a first sampling capacitor; a first field-effect transistor (FET) having a first conduction terminal for receiving the input signal, a second conduction terminal connected to said first sampling capacitor, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during a sampling time and for disconnecting the input signal from said first sampling capacitor during a holding time; a first buffer amplifier having an input connected to said first sampling capacitor and an output connected to the body of said first FET during the holding time for applying a holding voltage from said first sampling capacitor to the body of said first FET to thereby reduce undesired effects from the parasitic diode, said first buffer amplifier having a direct current (D.C.) offset; amplifier offset compensation means for compensating for the D.C. offset of said first buffer amplifier; and subthreshold conduction current compensation means for reducing undesired effects of subthreshold conduction current in said first FET during the holding time.

29. An integrated S/H circuit according to claim 28 wherein said amplifier offset compensation means comprises: offset determining means for determining an offset voltage generated by said first buffer amplifier; and offset correction means for generating an offset correction signal responsive to said offset determining means and coupling the offset correction signal to said first buffer amplifier.

30. An integrated S/H circuit according to claim 29 wherein said first buffer amplifier comprises a pair of inputs; and wherein said offset determining means comprises means for connecting both inputs to the holding voltage during a portion of the sampling time.

31. An integrated S/H circuit according to claim 29 wherein said offset determining means comprises storing means for storing the offset voltage of said first buffer amplifier.

32. An integrated S/H circuit according to claim 31 wherein said storing means comprises a second sampling capacitor and a second buffer amplifier connected thereto.

33. An integrated S/H circuit according to claim 32 wherein said offset correction means further comprises a differential amplifier having a first input connected to said second sampling capacitor, a second input connected to a reference voltage, and a pair of differential outputs connected to said first buffer amplifier.

34. An integrated S/H circuit according to claim 29 wherein said subthreshold conduction current compensation means comprises means for causing a voltage at the first conduction terminal of said first FET to be substantially equal to a voltage at the second conduction terminal of the first FET during the holding time.

35. An integrated S/H circuit according to claim 29 further comprising a second FET having a first conduction terminal connected to the input signal, a second conduction terminal connected to the first conduction terminal of said first FET, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during the sampling time and for disconnecting the input signal from said first sampling capacitor during the holding time.

36. An integrated S/H circuit according to claim 35 wherein said subthreshold conduction current compensation means further comprises means for connecting the holding voltage from the output of said first buffer amplifier to a node defined between the second conduction terminal of said second FET and the first conduction terminal of said first FET during the holding time.

37. An integrated S/H circuit according to claim 29 wherein said first buffer amplifier comprises an FET input stage.

38. A method for enhancing operation of an integrated sample-and-hold (S/H) circuit for an input signal, the S/H circuit of a type comprising a first sampling capacitor, a first field-effect transistor (FET) having a first conduction terminal for receiving the input signal, a second conduction terminal connected to said first sampling capacitor, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during a sampling time and for disconnecting the input signal from said first sampling capacitor during a holding time, the S/H circuit further comprising a first buffer amplifier having an input connected to said first sampling capacitor and an output connected to the body of said first FET during the holding time for applying a holding voltage from said first sampling capacitor to a body of said first FET, said first buffer amplifier having a direct current (D.C.) offset, the method comprising the step of: compensating for the D.C. offset of said first buffer amplifier.

39. A method according to claim 38 wherein compensating step comprises: determining an offset voltage generated by said first buffer amplifier; and generating an offset correction signal responsive to said offset determining means and coupling the offset correction signal to said first buffer amplifier.

40. A method according to claim 39 wherein said first buffer amplifier comprises a pair of inputs; and wherein the step of determining the offset comprises connecting both inputs to the input voltage during a portion of the sampling time.

41. A method according to claim 39 wherein the step of determining the offset comprises storing the offset voltage of said first buffer amplifier.

42. A method according to claim 41 wherein the step of storing comprises storing the offset voltage using second sampling capacitor and a second buffer amplifier connected thereto.

43. A method according to claim 39 wherein the step of compensating comprises sampling the offset voltage during a null time occurring during a portion of the sampling time.

44. A method according to claim 43 wherein the step of sampling during the null time comprises sampling during a null time of less than about 10 microseconds.

45. A method according to claim 38 further comprising the step of reducing undesired effects of subthreshold conduction current in said first FET during the holding time.

46. A method according to claim 45 wherein the step of reducing undesired effects of subthreshold conduction current comprises causing a voltage at the first conduction terminal of said first FET to be substantially equal to a voltage at the second conduction terminal of the first FET during the holding time.

47. A method according to claim 46 wherein said S/H circuit further comprises a second FET having a first conduction terminal connected to the input signal, a second conduction terminal connected to the first conduction terminal of said first FET, and a control terminal responsive to control signals for connecting the input signal to said first sampling capacitor during the sampling time and for disconnecting the input signal from said first sampling capacitor during the holding time; and wherein the step of compensating for the subthreshold conduction current comprises connecting the holding voltage from the output of said buffer amplifier to a node defined between the second conduction terminal of said second FET and the first conduction terminal of said first FET during the holding time.

48. A method according to claim 38 further comprising the step of generating an output signal based upon the holding voltage on said first sampling capacitor by connecting an output amplifier to said first sampling capacitor.