Multi-part lead frame with dissimilar materials and method of manufacturing

1. A method of manufacturing a semiconductor device assembly having a semiconductor device therein, said semiconductor device having an active surface having at least one bond pad thereon, said method comprising the steps of: forming a first lead frame of a first material, said first lead frame including a die paddle of said first material; attaching said semiconductor device to said die paddle; forming a second lead frame of a second material, said second lead frame including carriers and at least one inner lead portion; and securing a portion of said die paddle to a portion of said second lead frame.

2. The method of claim 1, further comprising the step of: connecting said at least one inner lead portion and said at least one bond pad of said semiconductor device.

3. The method of claim 1, wherein the step of securing comprises welding.

4. The method of claim 1, wherein the step of securing comprises adhesive bonding.

5. The method of claim 1, further comprising the step of: applying an insulating film to a portion of said active surface of said semiconductor device.

6. The method of claim 1, further comprising the step of: applying an insulating film between a portion of said active surface of said semiconductor device and said at least one inner lead portion.

7. The method of claim 1, further comprising the step of: molding said semiconductor device in a plastic body.

8. A method of manufacturing a semiconductor device assembly having a semiconductor device therein, said semiconductor device having an active surface having a bond pad thereon, said method comprising the steps of: forming a first lead frame including a die paddle, first carriers, each of said first carriers having at least one first alignment hole therein, at least one tie bar, and at least one attachment tab extending from said tie bar, said tie bar interconnecting said die paddle and a carrier of said first carriers; attaching said semiconductor device to said die paddle; forming a second lead frame including second carriers, each of said second carriers having an attachment tab receiving portion affixed thereto and at least one second alignment hole therein, and a plurality of leads, at least one lead of said plurality of leads having an inner lead portion and an outer lead portion; aligning said at least one first alignment hole of a carrier of said first carriers of said first lead frame and said at least one second alignment hole of a carrier of said second carriers of said second lead frame; securing said attachment tabs of said first lead frame to said attachment tab receiving portions of said second lead frame; and cutting said tie bar at a point between said attachment tabs and said first carriers.

9. The method of claim 8, further comprising the step of: connecting at least one of said inner lead portions and said at least one bond pad of said semiconductor device.

10. The method of claim 8, wherein the step of securing consists of welding said attachment tabs of said first lead frame to said attachment tab receiving portions of said second lead frame.

11. The method of claim 8, wherein the step of securing comprises adhesively bonding said attachment tabs of said first lead frame and said attachment tab receiving portions of said second lead frame.

12. The method of claim 8, wherein the first lead frame further includes tie bar cut zones located between said attachment tabs and said first carriers, and wherein the step of cutting said tie bar consists of cutting said tie bar cut zones.

13. The method of claim 8, further comprising the step of: applying an insulating film to a portion of said active surface of said semiconductor device.

14. The method of claim 8, further comprising the step of: applying an insulating film between a portion of said active surface of said semiconductor device and an inner lead portion of at least one of said at least one lead of said plurality of leads having an inner lead portion and an outer lead portion.

15. The method of claim 8, further comprising the step of: molding said semiconductor device in a plastic body.