Method for bonding semiconductor chip and device therefor

1. A semiconductor chip bonding method comprising: a step of photographing a surface of a semiconductor chip, on which an electrode is formed, and detecting a relative position of the electrode with respect to a semiconductor chip; a bonding step of making the electrode of the semiconductor chip to face a circuit provided on a substrate, and bonding the electrode to the circuit; a step of photographing the substrate on which the semiconductor chip is formed, and detecting a relative position of the semiconductor chip with respect to the substrate; and the step of evaluating a bonding accuracy by calculating a relative position of the electrode with respect to the substrate from the relative position of the semiconductor chip with respect to the substrate and the relative position of the electrode with respect to the semiconductor chip.

2. A bonding method according to claim 1, wherein the detection of the relative position of the electrode with respect to the semiconductor chip is performed with reference to an edge of the semiconductor chip.

3. A bonding method according to claim 1, wherein the detection of the relative position of the electrode with respect to the semiconductor chip is performed by detecting a position of an edge of the semiconductor ship and a position of the electrode adjacent to the edge.

4. A bonding method according to claim 1, wherein the detection of the relative position of the semiconductor chip with respect to the substrate is performed by detecting a position of a mark provided on the substrate and a position of an edge of the semiconductor chip.

5. A bonding method according to claim 1, wherein the circuit provided on the substrate is an electrode and/or a circuit pattern.

6. A bonding method according to claim 1, wherein the evaluation of the bonding accuracy is carried out by comparing the relative position of the electrode of the semiconductor chip with respect to the substrate, with a predetermined reference value.

7. A bonding method according to claim 6, further comprising a step for calculating the reference value.

8. A bonding method according to claim 7, wherein the step for calculating the reference value is performed by obtaining the relative position of the electrode with respect to the substrate in a case where the electrode of the semiconductor chip and the circuit on the substrate are aligned with each other.

9. A bonding method according to claim 6, further comprising an alarm step for generating an alarm when the relative position of the electrode of the semiconductor chip, with respect to the substrate, differs from the reference value by a predetermined degree.

10. A bonding method according to claim 1, wherein the step of detecting the relative position of the electrode with respect to the semiconductor chip, includes photographing of the semiconductor chip from a surface side on which the electrode is formed, and detecting a position of the electrode with reference to a predetermined location of the semiconductor chip; and the step of detecting the relative position of the semiconductor chip with respect to the substrate, includes photographing of the semiconductor chip mounted on the substrate, from a surface side on which the electrode is not formed, and detecting the relative position of the predetermined location of the semiconductor chip, with reference to an alignment mark formed on the substrate as a reference.

11. A bonding method according to claim 10, wherein the predetermined location is an edge of the semiconductor chip.

12. A bonding apparatus for mounting a semiconductor chip on a substrate, comprising: a first image pick up member configured to photograph a surface of the semiconductor chip on which an electrode is formed; a second image pick up member configured to photograph a surface of the substrate on which a semiconductor is mounted; a bonding mechanism configured to mount the semiconductor chip on the substrate by making the electrode of the semiconductor chip to face a circuit provided on the substrate, and bonding the electrode to the circuit pattern; an electrode position detection unit configured to calculate a relative position of the electrode of the semiconductor chip with respect to the substrate, from a relative position of the electrode with respect to the semiconductor chip, which was detected by the first image pick up member before the bonding and a relative position of the semiconductor chip with respect to the substrate, which was detected by the second image pick up member after the bonding; and an evaluation unit configured to evaluate a bonding accuracy on the basis of the relative position of the electrode with respect to the substrate, which is calculated by the electrode position detection unit.

13. A bonding apparatus according to claim 12, wherein the electrode position detection unit detects the relative position of the electrode with respect to the semiconductor chip, with reference to an edge of the semiconductor chip.

14. A bonding apparatus according to claim 13, wherein the electrode position detection unit detects the relative position of the electrode with respect to the semiconductor chip, by detecting a position of an edge of the semiconductor chip and a position of the electrode adjacent to the edge.

15. A bonding apparatus according to claim 12, wherein the electrode position detection unit detects the relative position of the semiconductor chip with respect to the substrate, by detecting a position of a mark provided on the substrate and a position of an edge of the semiconductor chip.

16. A bonding apparatus according to claim 12, wherein the evaluation unit evaluates the bonding accuracy by comparing the relative position of the electrode of the semiconductor chip with respect to the substrate, with a predetermined reference value.

17. A bonding apparatus according to claim 16, further comprising a reference value calculation unit configured to calculate the reference value.

18. A bonding apparatus according to claim 17, wherein the reference value calculation unit calculates the reference value by obtaining the relative position of the electrode with respect to the substrate in a case where the electrode of the semiconductor chip and the circuit on the substrate are aligned with each other.

19. A bonding apparatus according to claim 16, further comprising an alarm unit configured to generate an alarm when the relative position of the electrode of the semiconductor chip, with respect to the substrate, differs from the reference value by a predetermined degree or more.