Device for setting operating parameters in a plurality of programmable integrated circuits

1. A device for setting operating parameters in a plurality of programmable integrated circuits, in which each integrated circuit has a ground terminal, at which ground potential is present, an input, via which digital control commands to be evaluated by an internal controller are fed, and an output, via which control information items concerning the state of integrated circuit are output, the inputs of a plurality of integrated circuits are connected to one another, each output is passed separately to an external control unit, after the reception of an inhibit control command, each integrated circuit latches the evaluation of received control commands and puts its output into state in which control signals can be received and evaluated, the external control unit feeds an enable control signal to a selected integrated circuit via the output thereof, whereupon the internal controller cancels the latching, and in which control commands for setting the operating parameters are subsequently output to the inputs of the integrated circuits.

2. The device as claimed in claim 1, wherein the internal controller of each integrated circuit contains an evaluation circuit, which is connected to the output and detects the incoming enable control signal.

3. The device as claimed in claim 1, wherein an END control command is output after the transmission of the control commands for setting the operating parameters.

4. The device as claimed in claim 1, wherein each programmable monolithic integrated circuit contains a Hall generator for detecting magnetic field parameters.

5. The device as claimed in claim 1, wherein each internal controller contains a digital module, which outputs protocol signals to the external controller via the output.

6. A method for setting operating parameters in a plurality of programmable integrated circuits, in which each integrated circuit has a ground terminal, at which ground potential is present, an input, via which digital control commands to be evaluated by an internal controller are fed, and an output, via which control information items concerning the state of the integrated circuit are output, the inputs of a plurality of integrated circuits are connected to one another, each output is passed separately to an external control unit, after the reception of a inhibit control command, each integrated circuit latches the evaluation of received control commands and puts its output into a state in which control signals can be received and evaluated, the external control unit feeds an enable control signal to a selected integrated circuit via the output thereof, whereupon the internal controller cancels the latching, and in which control commands for setting the operating parameters are subsequently output to the inputs of the integrated circuits.

7. A programmable integrated circuit, having a ground terminal, an input, via which digital control commands to be evaluated by an internal controller are fed, and having an output, via which control information items concerning the state of the integrated circuit are output, wherein the controller, after the reception of an inhibit control command, latches the evaluation of received control commands, wherein the output is put into a state in which control signals can be received and evaluated, wherein the internal controller cancels the latching when an enable control signal is fed in at the output, and wherein control commands arriving at the input in this state initiate the setting of the operating parameters in the integrated circuit.

8. The integrated circuit as claimed in claim 7, wherein the internal controller contains an evaluation circuit, which is connected to the output and detects the incoming enable control signal.

9. The integrated circuit as claimed in claim 7, wherein a received END control command is initiated after the transmission of the control commands for setting the operating parameters, and wherein the evaluation of received control commands is latched.

10. The integrated circuit as claimed in claim 7, wherein it contains a Hall generator for detecting magnetic field parameters.

11. The integrated circuit as claimed in claim 7, wherein the internal controller contains a digital module, which outputs protocol signals to an external controller via the output.