Patentable/Patents/US-6327038
US-6327038

Linear and angular retroreflecting interferometric alignment target

PublishedDecember 4, 2001
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

The present invention provides a method and apparatus for measuring both the linear displacement and angular displacement of an object using a linear interferometer system and an optical target comprising a lens, a reflective surface and a retroreflector. The lens, reflecting surface and retroreflector are specifically aligned and fixed in optical connection with one another, creating a single optical target which moves as a unit that provides multi-axis displacement information for the object with which it is associated. This displacement information is useful in many applications including machine tool control systems and laser tracker systems, among others.

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Patent Metadata

Filing Date

September 21, 1999

Publication Date

December 4, 2001

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