A closed space is formed in a reduced pressure drying station, and the closed space is brought to a vacuum state. In this state, an EB unit irradiates a wafer mounted on a hot plate with an electron beam to foam an insulating film material. Subsequently, the hot plate is raised to a predetermined temperature, and drying processing is performed under a reduced pressure. As described above, since the foaming processing is performed in the reduced pressure drying station, bubbles remain in the insulating film, so that the existence of the bubbles can decrease the relative dielectric constant.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A coating apparatus, comprising: a first processing chamber having a rotatable supporter for rotating a substrate while holding it, and a supplier for supplying an insulating film material onto the substrate held by the rotatable supporter; a foaming mechanism for foaming the insulating film material supplied on the substrate under a reduced pressure; a second processing chamber for drying the insulating film material on the substrate; and a transporter for transporting the substrate from the first processing chamber to the second processing chamber.
2. The apparatus according to claim 1 , wherein the foaming mechanism is provided in the second processing chamber.
3. The apparatus according to claim 1 , wherein the foaming mechanism has an ultrasound supply mechanism for supplying an ultrasound to the insulating film material.
4. The apparatus according to claim 1 , wherein the foaming mechanism has a vibration supply mechanism for supplying a vibration to the insulating film material.
5. The apparatus according to claim 1 , wherein the foaming mechanism has an infrared ray lamp for irradiating the insulating film material with an infrared ray.
6. The apparatus according to claim 1 , wherein the foaming mechanism has an electron beam irradiation mechanism for irradiating the insulating film material with an electron beam.
7. The apparatus according to claim 6 , wherein the insulating film material applied on the substrate has an upper layer portion and a lower layer portion, and wherein the electron beam irradiation mechanism intensively irradiates the lower layer portion.
8. The apparatus according to claim 1 , further comprising: a third processing chamber for performing heat processing for the substrate at a high temperature; wherein the transporter transports the substrate from the second processing chamber to the third processing chamber, and wherein the coating apparatus further comprises a controller for controlling the transporter to keep constant a period of time required to transport the substrate from the second processing chamber to the third processing chamber.
9. The coating apparatus, comprising: a first processing chamber having a rotatable supporter for rotating a substrate while holding it, and a supplier for supplying an insulating film material onto the substrate held by the rotatable supporter; a second processing chamber for drying the substrate under a reduced pressure while an ultrasound is supplied to the insulating film material on the substrate; and a transporter for transporting the substrate from the first processing chamber to the second processing chamber.
10. The apparatus according to claim 9 , wherein the second processing chamber further comprises a mechanism for turning over the substrate.
11. The apparatus according to claim 9 , wherein the insulating film material applied on the substrate has a front face; and wherein the second processing chamber further comprises a baking unit for baking the front face of the insulating film material applied on the substrate.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
March 21, 2001
August 13, 2002
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