CMOS image sensor array having charge spillover protection for photodiodes

1. A photosensitive apparatus, comprising: a photodiode; a transfer circuit associated with the photodiode, for transferring a signal from the photodiode to an output line; and a spillover protection device, independently controllable relative to the transfer circuit, for applying a potential to the photodiode in response to a spillover condition in which a charge on the photodiode exceeds a predetermined threshold; and clocking means for providing, within each cycle of operation, an integration period in which charge generated by the photodiode is integrated to yield a signal related to light impinging on the photodiode, and an inactive period wherein light impinging on the photodiode is not integrated to yield a signal, and causing the transfer circuit to periodically inject a predetermined bias charge on the photodiode during the inactive period of each cycle of operation, the clocking means further disabling the spillover protection device while the predetermined bias charge is injected on the photodiode.

2. The apparatus of claim 1 , the spillover protection device including a transistor having a gate, a source, and a drain, the source being connected to a node between the photodiode and the transfer circuit, the drain being connected to the gate, and the gate connectable to a reference voltage.

3. The apparatus of claim 1 , the clocking means causing the reference voltage on the gate of the transistor in the spillover protection circuit to be decreased while the predetermined bias charge is injected on the photodiode.

4. A method of operating a photosensitive apparatus comprising a photodiode and a spillover protection device for applying a potential to the photodiode in response to a spillover condition in which a charge on the photodiode exceeds a predetermined threshold, the method comprising the steps of: providing, within each cycle of operation, an integration period in which charge generated by the photodiode is integrated to yield a signal related to light impinging on the photodiode, and an inactive period wherein light impinging on the photodiode is not integrated to yield a signal; injecting a predetermined bias charge on the photodiode during the inactive period of each cycle of operation; and disabling the spillover protection device while the predetermined bias charge is injected on the photodiode.

5. The method of claim 4 , wherein the spillover protection device includes a transistor having a gate, a source, and a drain, the source being connected to a node between the photodiode and the transfer circuit, the drain being connected to the gate, and the gate connectable to a reference voltage, the disabling step including decreasing the reference voltage applied to the gate.

6. The method of claim 4 , wherein the spillover protection device includes a transistor having a gate, a source, and a drain, the source being connected to a node between the photodiode and the transfer circuit, the drain being connected to the gate, and the gate connectable to a reference voltage, the reference voltage being higher than a threshold voltage associated with the transistor in the spillover protection device, and lower than a sum of the threshold voltage associated with the transistor in the spillover protection circuit and a voltage which corresponds to a maximum signal from the photodiode.