Patentable/Patents/US-6721050
US-6721050

Method and device for the spectral analysis of light

PublishedApril 13, 2004
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

The method uses a physical phenomenon of dispersion of the optical rotation for identification of the spectral characteristics of light Polychromatic linearly polarized radiation passes through the environment that rotates a polarization plane of its spectral components, depending on their wavelength. After a subsequent passage through the analyzing polarizer, a dependence of the light intensity S(&phgr;) on the angle &phgr;, that the analyzing polarizer forms with the polarization plane of the analyzed light, is measured. S(&phgr;) is in a mathematical relationship with the spectrum of the analyzed radiation I(&lgr;), where &lgr; is a wavelength. S(&phgr;) allows for the determination of the spectral characteristics of the analyzed radiation. In devices based on the above principle, the collimated polarized beam of the analyzed radiation passes first through the optical element that exhibits a dispersion of the optical rotation, i.e. rotator (4), then through the analyzing polarizer (5), and after a projection is detected by a proper detector (7). The detector measures S(&phgr;) as a function of the angle &phgr; of the analyzer. From S(&phgr;) the parameters of the spectrum I(&lgr;) are determined.

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Filing Date

March 8, 2001

Publication Date

April 13, 2004

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