Patentable/Patents/US-6750975
US-6750975

Three-dimensional shape measuring method

PublishedJune 15, 2004
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

A three-dimensional shape measuring method by which measurement of a three-dimensional shape is realized with an improved precision. Grid patterns comprising a plurality of one-dimensional grids 1, 2 and 3, each having a period and direction different from those of the others, are simultaneously projected upon objects to be measured, using different colors for each of the one-dimensional grids 1, 2 and 3. Subsequently, a grid image deformed in accordance with the three-dimensional shapes of the objects to be measured is imaged, the grid image is separated by colors into one-dimensional grid components of each color, a phase for each of the one-dimensional grid components is detected, and then, measurement values of the three-dimensional shapes are obtained on the basis of the detected phases. At the same time, by imaging the objects to be measured by use of white light, color information on the objects to be measured are measured as well.

Patent Claims
12 claims

Legal claims defining the scope of protection, as filed with the USPTO.

1

1. A method for obtaining a measurement value of a three-dimensional shape of an object, using a grid image formed by projecting a plurality of grid patterns upon the object to be measured, the method comprising the steps of: providing a plurality of one-dimensional grids of different colors, with each one of the plurality of one-dimensional grids of different colors having a different rotation angle from another; projecting the grid patterns, from the plurality of one-dimensional grids of different colors, upon the object to be measured; imaging the grid patterns deformed in accordance with the three-dimensional shape of the object to be measured; separating from the grid image each of the one-dimensional grids of different colors; detecting a phase for each of the one-dimensional grids; and obtaining the measurement value on the basis of the detected phases.

2

2. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 1 , wherein the colors of the one-dimensional grids of different colors are red, green and blue.

3

3. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 2 , wherein the colors of the one-dimensional grids of different colors are projected through a plurality of prism mechanisms by a plurality of white light sources.

4

4. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 2 , wherein the grid patterns comprise dots.

5

5. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 1 , wherein the grid patterns comprise sinusoidal lines.

6

6. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 1 , wherein a straight line connecting a center of a projection lens which projects the grid patterns with a center of an image formation lens which senses the images of the grid patterns is parallel to a reference surface on which the object to be measured is placed.

7

7. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 6 , wherein an optical axis of the image formation lens is perpendicular to the reference surface.

8

8. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 1 , further comprising the step of measuring color information of the object to be measured by imaging the object using white light.

9

9. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 1 , wherein the phases for each of the one-dimensional grids have periods that when compared to each other have ratios represented by prime numbers.

10

10. The method for obtaining a measurement value of a three-dimensional shape of an object as recited in claim 9 , wherein a measurement sensitivity ratio for transforming a height of the object into a phase value is determined from a periodic ratio in a horizontal direction of the one-dimensional grids.

11

11. The method for obtaining a measurement value of a three-dimensional shape of an object, using a grid image formed by projecting a plurality of grid patterns upon the object to be measured, the method comprising the steps of: providing at least three one-dimensional grids of different colors, with each one of the at least three one-dimensional grids of different colors having a different rotation angle from another; projecting the grid patterns, from the at least three-dimensional grids of different colors, upon the object to be measured; imaging the grid patterns deformed in accordance with the three-dimensional shape of the object to be measured; separating from the grid image each one-dimensional grid component of different colors; obtaining an intensity distribution of spatial frequency spectrums through Fourier-transformation; selectively extracting spectral components corresponding to the spatial frequency spectrums by means of a spatial frequency filter; performing an inverse two-dimensional Fourier transform on the selected spectral component; detecting a phase for each of the one-dimensional grid components; and obtaining the measurement value on the basis of the detected phases.

12

12. A method for obtaining a measurement value of a three-dimensional shape of an object, using a grid image formed by projecting a plurality of grid patterns upon the object to be measured, the method comprising the steps of: providing at least three one-dimensional grids of different colors, with each one of the at least three one-dimensional grids of different colors having a different rotation angle from another; projecting the grid, from the at least three one-dimensional grids of different colors, upon the object to be measured; imaging the grid patterns deformed in accordance with the three-dimensional shape of the object to be measured; separating from the grid image each one-dimensional grid component of different colors; extracting, selectively, through a two-dimensional filter window function a desired spectrum and inversely Fourier transforming the spectrum to obtain a two-dimensional impulse response function; carrying out a direct, two-dimensional convolution operation on the two-dimensional impulse response function to obtain spectral components corresponding to the one-dimensional grid components; detecting a phase for each of the one-dimensional grid components; and obtaining the measurement value on the basis of the detected phases.

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Patent Metadata

Filing Date

November 27, 2001

Publication Date

June 15, 2004

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