Patentable/Patents/US-6831740
US-6831740

Methodology for improving precision of data acquired by spectrophotometer systems

PublishedDecember 14, 2004
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

Disclosed are spectrophotometer systems and methodology for obtaining data of improved precision therefrom, including replacement of data determined to be suspect based on comparison of multiple baselines.

Patent Claims

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Classification Codes (CPC)

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G01N
Patent Metadata

Filing Date

August 9, 2001

Publication Date

December 14, 2004

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