A bump is formed on at least one of a semiconductor chip and printed circuit board. A sealing material is applied to the surface of one of the semiconductor chip and printed circuit board. The printed circuit board is flip-chip-connected to the semiconductor chip via the sealing material while ultrasonic waves are applied to the printed circuit board to promote bonding by the bump.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A semiconductor device manufacturing method comprising: forming a bump on at least one of a semiconductor chip and a printed circuit board; applying a sealing material to a surface of one of the semiconductor chip and the printed circuit board; fixing a surface of the semiconductor chip opposite to an element formation surface to a porous stage by porous chucking; chucking a surface of the printed circuit board opposite to a wiring electrode formation surface by a tool; moving down the tool toward the porous stage, facing down the printed circuit board on the semiconductor chip, and thereby opposing the semiconductor chip to the printed circuit board via the bump; and flip-chip-connecting the printed circuit board to the semiconductor chip via the sealing material while applying ultrasonic waves to the printed circuit board to promote bonding by the bump, wherein the flip-chip-connecting includes electrically connecting the semiconductor chip and the printed circuit board via the bump, and sealing the semiconductor chip and the printed circuit board by the sealing material.
2. The method according to claim 1 , wherein flip chip connection is executed by pressing at least one of the printed circuit board and the semiconductor chip.
3. The method according to claim 1 , further comprising heating at least one of the stage and the tool.
4. The method according to claim 1 , which further comprises fixing the semiconductor chip to a transfer member, and in which the transfer member is chucked and fixed to the stage.
5. The method according to claim 1 , which further comprises fixing the printed circuit board to a transfer member, and in which, in flip chip connection, the transfer member is chucked and fixed to the tool to fix the semiconductor chip.
6. The method according to claim 1 , wherein the bump includes any one of a plated bump, a stud bump, a ball bump, and a printed bump.
7. The method according to claim 1 , further comprising, before the forming the bump: forming an element on a wafer; forming a groove along a dicing line or a scribing line of the wafer, the groove being shallow enough not to reach, from the element formation surface, the surface opposite to the element formation surface of the wafer; and grinding the surface opposite to the element formation surface of the wafer, and simultaneously thinning the wafer and dividing it into chips.
8. A semiconductor device manufacturing method comprising: forming a bump on at least one of a semiconductor chip and a printed circuit board; applying a sealing material to a surface of one of the semiconductor chip and the printed circuit board; and flip-chip-connecting the printed circuit board to the semiconductor chip via the sealing material while applying a first ultrasonic wave to the printed circuit board and applying a second ultrasonic wave to the semiconductor chip at a power lower than a power of the first ultrasonic wave to promote bonding by the bump.
9. The method according to claim 8 , wherein flip chip connection is executed by facing down the printed circuit board on the semiconductor chip.
10. The method according to claim 8 , wherein the semiconductor chip is fixed on a stage.
11. The method according to claim 8 , wherein flip chip connection is executed by pressing at least one of the printed circuit board and the semiconductor chip.
12. The method according to claim 8 , which further comprises chucking by a stage a surface of the semiconductor chip opposite to an element formation surface to fix the semiconductor chip, and chucking by a tool a surface of the printed circuit board opposite to a wiring electrode formation surface, and in which flip chip connection includes moving down the tool toward the stage, electrically connecting the semiconductor chip and the printed circuit board via the bump, and sealing the semiconductor chip and the printed circuit board by the sealing material.
13. The method according to claim 12 , further comprising heating at least one stage and the tool.
14. The method according to claim 12 , wherein the chucking by stage is chucking by porous chucking.
15. The method according to claim 12 , which further comprises fixing the semiconductor chip to a transfer member, and in which the transfer member is chucked and fixed to the stage.
16. The method according to claim 12 , which further comprises fixing the printed circuit board to a transfer member, and in which, in flip chip connection, the transfer member is chucked and fixed to the tool to fix the semiconductor chip.
17. The method according to claim 8 , wherein the bump includes any one of a plated bump, a stud bump, a ball bump, and a printed bump.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
March 5, 2003
January 4, 2005
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