A semiconductor device and its manufacturing method with which the connection reliability can be improved without complicating the manufacturing process. Semiconductor chip 102 is mounted on the principal surface of insulated substrate 104, and a conductive paste containing a heat-curing epoxy resin is supplied to via holes 116 from the back of insulated substrate 104. Then, solder balls 118 are transferred onto the conductive paste of insulated substrate 104, and reflow soldering is applied in order to bond solder balls 118 to insulated substrate 104. During the reflow soldering, the heat-curing epoxy resin forms resin parts 120 around solder balls 118.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A semiconductor device comprising: an insulated substrate having a principal surface and an opposing secondary surface, said insulated substrate having multiple via holes extending between the principal and secondary surfaces and multiple conductor patterns in contact with the said via holes on the principal surface of said insulated substrate, a semiconductor chip having electrode pads and mounted on the principal surface of said insulated substrate, connection elements forming electrical connections between electrode pads of said semiconductor chip and said conductor patterns, multiple external connection terminals disposed on the secondary surface of said insulated substrate that correspond to said via holes and connected to said conductor patterns, first resin parts disposed on said secondary surface and at the periphery parts of said external connection terminals using a heat-curing epoxy resin; a wiring board having wiring parts thereon, said external connection terminals contacting said wiring parts; and second resin parts disposed on said wiring board and at the periphery parts of said external connection terminals.
2. The semiconductor device of claim 1 in which said external connection terminals are conductive balls.
3. A method for manufacturing a semiconductor device comprising the steps of: providing an insulated substrate having a principal surface and a secondary surface, said insulated substrate having multiple via holes for providing external connection terminals and multiple conductive patterns in contact with said via holes on the principal surface side, mounting a semiconductor chip having electrode pads on the principal surface side of said insulated substrate, and forming electrical connections between the electrode pads of said semiconductor chip and said conductive patterns, applying a conductive paste containing a heat-curing epoxy resin to said via holes, applying external connection terminals to said via holes at the secondary surface; and forming resin parts at the periphery parts of the external connection terminals on said secondary surface using the heat-curing epoxy resin contained in said conductive paste.
4. The method for manufacturing a semiconductor device of claim 3 further comprising the step of moving conductive balls serving as said external connection terminals onto said conductive paste, wherein said resin parts are formed at the periphery parts of said conductive balls.
5. The method for manufacturing a semiconductor device of one of claim 3 in which the content of the heat-curing epoxy resin of said conductive paste is between 10 wt % and 15 wt %, inclusive.
6. The method for manufacturing a semiconductor device of one of claim 4 in which the content of the heat-curing epoxy resin of said conductive paste is between 10 wt % and 15 wt %, inclusive.
7. A method for manufacturing a semiconductor device comprising the steps of: providing a semiconductor chip having an electronic circuit and electrode pads on a surface of said semiconductor chip, applying a conductive paste containing a heat-curing epoxy resin to said electrode pads; and forming electrical connections with said electrode pads by applying external connection terminals to said electrode pads through said conductive paste to form resin parts at the periphery parts of the external connection terminals using the heat-curing epoxy resin contained in said conductive paste; in which the content of the heat-curing epoxy resin of said conductive paste is between 10 wt % and 15 wt %, inclusive.
8. A method for manufacturing a semiconductor device comprising the steps of: providing a semiconductor chip having an electronic circuit and electrode pads on a surface of said semiconductor chip, applying a conductive paste containing a heat-curing epoxy resin to said electrode pads; and forming electrical connections with said electrode pads by applying external connection terminals to said electrode pads through said conductive paste to form resin parts at the periphery parts of the external connection terminals using the heat-curing epoxy resin contained in said conductive paste; further including the step of providing a wiring board having wiring parts thereon; contacting said external connection terminals and said wiring parts; and disposing second resin parts on said wiring board and at the periphery parts of said external connection terminals.
9. The method of claim 3 wherein said step of applying external connection terminals to said via holes at the secondary surface causes at least some of said heat conducting epoxy resin to exit said via holes and to form said resin parts at the periphery parts of the external connection terminals on said secondary surface.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
September 24, 2002
May 3, 2005
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