Typically, primary electrical connection between a semiconductor chip and an external solder ball contact on a Ball Grid or Chip Scale Package is by way of a via extending through a dielectric substrate. The aspect ratio between via diameter and depth is critical for reliable and high yield solder ball attachment during printed circuit board assembly. Excellent ball adherence and reliability of BGA solder ball contacts is achieved through controlling the aspect ratio of the substrate vias by partially plating a solid solderable conductor core in each via. An improved via structure is disclosed wherein the depth of the viva is reduced without the negative effects of alternate methods, such as thinner substrates, or wider vias.
Legal claims defining the scope of protection, as filed with the USPTO.
1. A manufacture comprising: a) a dielectric substrate having a first surface, a second surface, and one or more vias between the surfaces, b) a metal pattern on the first surface including one or more bonding pads covering the vias, c) a solderable metal member within the vias forming the bottom surface of a solid column of conductive material, the column filling the via and connecting the metal pattern, and d) a solder ball extending into a via from the second surface, contacting the solderable metal member at an end of the solid column.
2. The manufacture of claim 1 , in which the solid column comprises copper.
3. The manufacture of claim 1 , in which the solid column comprises nickel.
4. The manufacture of claim 1 , in which the solid column comprises nickel and copper.
5. The manufacture of claim 1 , in which the solderable metal member comprises gold.
6. The manufacture of claim 5 , in which the solder member is substantially free of lead.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
June 26, 2003
January 24, 2006
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