Method and apparatus for testing liquid crystal display

1. A method for inspecting a display device substrate having a plurality of signal wirings and a plurality of electrostatic discharge damage (ESD) protection devices, each of the ESD protection devices being respectively on a corresponding one of the signal wirings, the method comprising steps of: using a shorting bar to individually short-circuit both ends of each of the ESD protection devices to form a current path on the corresponding one of the signal wirings; supplying a current to the corresponding one of the signal wirings; and determining a defectiveness of the corresponding one of the signal wirings depending on the current flowing on the corresponding one of the signal wirings.

2. The method according to claim 1 , wherein the short-circuiting step comprises moving the shorting bar to short-circuit the both ends of each of the ESD protection devices.

3. The method according to claim 1 , wherein the step of supplying the current to the corresponding one of the signal wirings includes: supplying a high voltage through a first shorting wiring connected to the corresponding one of the signal wirings; and supplying a low voltage through a second shorting wiring connected to the at least one of the ESD protection devices.

4. The method according to claim 1 , wherein in the short-circuiting step, the display device substrate is a TFT array substrate of a liquid crystal display.

5. An apparatus for inspecting a display device substrate having a plurality of signal wirings and a plurality of electrostatic discharge damage (ESD) protection devices, each of the ESD protection devices being respectively on a corresponding one of the signal wirings, the apparatus comprising: a conductive shorting bar to individually short-circuit both ends of each of the ESD protection devices to form a current path on the corresponding one of the signal wirings; a power supply to supply a current to the corresponding one of the signal wirings; and a detection circuit to determine a defectiveness of the corresponding one of the signal wirings depending on the current flowing on the corresponding one of the signal wirings.

6. The apparatus according to claim 5 , wherein the conductive shorting bar is provided in a jig and is movable.

7. The apparatus according to claim 5 , further comprising: a first shorting wiring connected to the corresponding one of the signal wirings; and a second shorting wiring connected to the at least one of the ESD protection devices, wherein the power supply supplies a high voltage to the corresponding one of the signal wirings through the first shorting wiring, and a low voltage to the at least one of the ESD protection devices through the second shorting wiring.

8. The apparatus according to claim 5 , wherein the display device substrate is a TFT array substrate of a liquid crystal display.

9. An apparatus for inspecting a display device substrate having a plurality of signal wirings and a plurality of electrostatic discharge damage (ESD) protection devices connected to the signal wiring, each of the ESD protection devices being respectively on a corresponding one of the signal wirings, the apparatus comprising: a movable conductive shorting bar, the conductive shorting bar being movable to selectively short-circuit both ends of at least one of the ESD protection devices to form a current path on the corresponding one of the signal wirings; a power supply to supply a current to the corresponding one of the signal wirings; and a detection circuit to determine a defectiveness of the corresponding one of the signal wirings depending on the current flowing on the corresponding one of the signal wirings.