Land circle calculating means (7) calculates a land circle as an approximate circle from label information (S6). Land circle accuracy-enhancing means (8) calculates again the land circle by changing a mask angle if land circle candidate information (S7) obtained is improper, so as to enhance the accuracy of the land circle. AND operation means (11) carries out an AND operation of a land circle image (S9) and a binary image (S10) to create a land missing image (S11). In-land binary means (12) calculates an in-land defect image (S12) from an original image (S4). OR operation means (13) carries out an OR operation of the in-land missing image (S11) and the in-land defect image (S12) to create a land defect image (S13).
Legal claims defining the scope of protection, as filed with the USPTO.
1. A land appearance inspection device, comprising: binarizing means, whereby an input image read by scanning a measurement object pattern with a photoelectric conversion scanner is converted into a binarized image; land circle calculating means for calculating a land circle which approximates a land shape from the binarized image converted by said binarizing means; and land circle accuracy enhancing means for calculating a land circle which minimizes an error of the land circle calculated by said land circle calculating means; wherein land coordinates of an amorphous land with a protrusion portion are detected with high accuracy, based on the land circle calculated by said land circle accuracy enhancing means.
2. A land appearance inspection device according to claim 1 , further comprising: land defect detection means for detecting a land internal defect and land circumferential break, based on the land circle calculated by said land circle accuracy enhancing means; and determination means for determining land quality, based on the land internal defect and land circumferential break results detected by said land defect detection means.
3. A land appearance inspection device according to claim 1 , further comprising: land internal binarization means for extracting a land internal defect, based on the land circle calculated by said land circle calculating means.
4. A land appearance inspection device according to claim 3 , further comprising: land external defect detection means for detecting a land circumferential break, based on the land circle calculated by said land circle accuracy enhancing means and the land internal defect extracted by said land internal binarization means.
5. A land appearance inspection device according to claim 1 , further comprising: land area calculation means for calculating land area based on the binarized image converted by said binarizing means; land circle area calculation means for calculating land circle area based on the land circle calculated by said land circle accuracy enhancing means; and land protrusion portion area calculation means for calculating a proportion of land protrusion portion area, based on the land area calculated by said land area calculation means and the land circle area calculated by said land circle area calculation means.
6. A land appearance inspection method, comprising the steps of: binarizing an input image read by scanning a measurement object pattern with a photoelectric conversion scanner; calculating a land circle which approximates a land shape from the binarized image; calculating a land circle which minimizes an error of said land circle; and detecting land coordinates of an amorphous land with a protrusion portion, based on said land circle.
7. A land appearance inspection method according to claim 6 , wherein a land internal defect and land circumferential break are detected, based on said land circle.
8. A land appearance inspection method according to claim 6 , wherein a land internal defect is extracted, based on said land circle.
9. A land appearance inspection method according to claim 8 , wherein a land circumferential break is detected, based on said land circle and said land internal defect.
10. A land appearance inspection method according to claim 6 , wherein: land area is calculated based on said binarized image; land circle area is calculated based on said land circle; and a proportion of land protrusion portion area is calculated based on said land area and said land circle area.
Cooperative Patent Classification codes for this invention. Click any code to explore related patents in that topic.
March 12, 2002
July 31, 2007
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