Patentable/Patents/US-7307734
US-7307734

Interferometric sensor for characterizing materials

PublishedDecember 11, 2007
Assigneenot available in USPTO data we have
Inventorsnot available in USPTO data we have
Technical Abstract

An integrated optical sensor, using low coherence interferometry, is capable of determining analyte concentration in a material sample based on absorption, scattering and polarization. The sensor includes one or more light collectors, with each collector having a separation distance from the region where the sample is illuminated by the source. The light backscattered from the sample is combined with reference arm light at the same optical path length for each light collector. The intensity of interference may be correlated with the concentration of an analyte in the material, for example the glucose concentration in a turbid medium like skin. The sensor operation can be based on fiber optics technology, integrated optics, or a combination of these. The operation is such that the spectrally resolved scattering and absorption coefficients can be measured simultaneously. In addition, the operation of the sensor can be synchronized with other sensors, for example temperature, pressure, or heartrate.

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Patent Metadata

Filing Date

August 16, 2004

Publication Date

December 11, 2007

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